Synthesis of nano-crystalline germanium carbide using radio frequency magnetron sputtering
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文摘

Nano-crystalline GexC1 − x films were grown at 350 °C on Si (100) substrates.

Maximum 15.5% of GexC1 − x is found using Levenberg–Marquardt peak analyser algorithm.

Transmission electron microscopy image shows the formation of nano-crystal of 5.53 Å.

Local Ge–C mode is identified near 530 cm− 1 in GexC1 − x film using Raman spectroscopy.

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