An interface study of indium tin oxide on Polyethylene Terephthalate with Nickel Phthalocyanine by photoelectron spectroscopies: The effect of cleaning pretreatment
详细信息 查看全文
- 作者：Dimitris Tsikritzis<sup> ; sup><sup>tsikritzis@chemeng.upatras.grsup> ; Fotini Petraki ; Stella Kennou
- 关键词：ITO ; PET ; Nickel Phthalocyanine ; XPS ; UPS ; Chemical treatment ; Surface contamination ; Argon sputtering
- 刊名：Microelectronic Engineering
- 出版年：2012
- 出版时间：February, 2012
- 年：2012
- 卷：90
- 期：Complete
- 页码：66-68
- 全文大小：279 K
文摘
In this work the effect of the chemical treatment, argon sputtering and heating on the surface of indium tin oxide (ITO) on a Polyethylene Terephthalate (PET) substrate as well as the influence of the surface chemical pretreatment on the interface formation with Nickel Phthalocyanine (NiPc) was studied. The sample was characterized by X-ray and ultraviolet photoelectron spectroscopies (XPS, UPS) for the as-received specimen, after chemical treated ex-situ by a solution of methanol, isopropanol, H<sub>2sub>O and by a ¦§<sub>2sub>¦¯-¦§<sub>2sub>¦¯<sub>2sub>-¦¦§<sub>4sub>¦¯¦§ solution. In addition, it was heated up to 110 ¡ãC and after a mild argon sputtering in ultra high vacuum (UHV). The electronic structure of the interface of Nickel Phthalocyanine with ITO/PET, which has been chemically treated, was investigated. The results show that the adsorbed carbon layer affects the interface energetics. No dipole formation was observed and the alignment of the energy levels at the interface is approaching the Schottky-Mott limit. They are compared with a previous study concerning the Nickel Phthalocyanine interfaced with sputtered clean ITO surface on glass.