High speed measurement of corn seed viability using hyperspectral imaging
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- 作者：Ashabahebwa Ambrosea ; ashabahebwa.ambrose@gmail.com" class="auth_mail" title="E-mail the corresponding author ; Lalit Mohan Kandpala ; lalitm85@gmail.com" class="auth_mail" title="E-mail the corresponding author ; Moon S. Kimb ; moon.kim@ars.usda.gov" class="auth_mail" title="E-mail the corresponding author ; Wang-Hee Leea ; wanghee@cnu.ac.kr" class="auth_mail" title="E-mail the corresponding author ; Byoung-Kwan Choa ; chobk@cnu.ac.kr" class="auth_mail" title="E-mail the corresponding author
- 关键词：Hyperspectral imaging ; Corn seed ; Viability ; PLS-DA ; Image processing
- 刊名：Infrared Physics & Technology
- 出版年：2016
- 出版时间：March 2016
- 年：2016
- 卷：75
- 期：Complete
- 页码：173-179
- 全文大小：1513 K
文摘
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HSI technique was developed for investigation of microwave treated corn seeds.
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PLSDA model classified treated and untreated corn seeds with high accuracy.
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Image processing method was helpful for visualization and detection of untreated seeds form treated seeds.
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HSI demonstrated a potential tool for detection of corn viability effected by heat treatment.