Development of an electron electron ion coincidence analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy

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• 作者：Takuhiro Kakiuchi ; Eiichi Kobayashi ; Naoyuki Okada ; Ken Oyamada ; Makoto Okusawa ; Koji K. Okudaira ; Kazuhiko Mase
• 关键词：Auger photoelectron coincidence spectroscopy ; Photostimulated desorption (PSD) ; Synchrotron radiation ; Cylindrical mirror analyzer (CMA) ; Ion mass spectroscopy ; Coincidence spectroscopy
• 刊名：Journal of Electron Spectroscopy and Related Phenomena
• 出版年：2007
• 出版时间：October 2007
• 年：2007
• 卷：161
• 期：1-3
• 页码：164-171
• 全文大小：1159 K

文摘

We have developed an electron electron ion coincidence (EEICO) analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy. It consists of a coaxially symmetric mirror electron energy analyzer (coASMA), a miniature cylindrical mirror electron energy analyzer (CMA), a miniature time-of-flight ion mass spectrometer (TOF-MS), a xyz stage, a tilt-adjustment mechanism, and a conflat flange with an outer diameter of 203 mm. A sample surface is irradiated by synchrotron radiation, and emitted electrons are energy-analyzed and detected by the coASMA and the CMA, while desorbed ions are detected by the TOF-MS. The performance of the new EEICO analyzer was tested by measuring Si-LVV-Si-2p APECS data of clean Si(1 1 1)7 × 7 and Si(1 1 1)7 × 7 covered by dissociated H₂O, and by measuring the Auger-electron photoion coincidence (AEPICO) spectra of condensed H₂O at the 4a₁ ← O 1s resonance.