文摘
Alpha spectroscopy can be used to quantify actinide (e.g., U, Pu) concentration in a molten salt electrorefining environment. One could electroplate actinide samples directly onto a semiconductor alpha particle detector to obtain representative isotopic concentrations from a measured alpha particle energy spectrum. In this work, we fabricated a SiC Schottky device that can be partially biased to a depletion depth of 8.8 µm that is able to measure the energy spectrum of 4.012 MeV alpha particles emitted from a thorium film with a thickness. We also present a method in calculating the thickness of a medium thick alpha source with a dE/dx detector.