X-ray diffraction and Raman scattering in SbSI nanocrystals

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• 作者：Gomonnai ; A.V. ; Voynarovych ; I.M. ; Solomon ; A.M. ; Azhniuk ; Yu.M. ; Kikineshi ; A.A. ; Pinzenik ; V.P. ; et. al.
• 关键词：A. Inorganic compounds ; A. Nanostructures ; C. Raman spectroscopy ; C. X-ray diffraction
• 刊名：Materials Research Bulletin
• 出版年：2003
• 期刊代码：60_00255408
• 类别：ms
• 出版时间：October 30, 2003
• 卷：38
• 期：13
• 页码：1767-1772
• 文件大小：130 K

摘要

Lattice structure and rod-like shaped SbSI nanocrystals obtained by ball milling with rod thickness down to 70nm, as estimated from X-ray diffraction (XRD) and electron microscopy, is similar to that of the bulk crystals. The dependence of the grain size on the milling duration is discussed in view of the chain-like crystalline structure of SbSI. Possible factors, responsible for the observed Raman line broadening, are discussed, scattering by surface phonons being considered the predominant one.