Depth profiling ¹³⁷Cs and ⁶⁰Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm

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• 作者：Jamie C. Adams^a ; ^{jcadams@univ.bangor.ac.uk} ; Malcolm J. Joyce^a ; Matthew Mellor^b
• 关键词：Depth profiling ; Radioactive contamination ; Gamma spectrometry ; Cadmium telluride ; Principal component analysis ; Shielding
• 刊名：Applied Radiation and Isotopes
• 出版年：2012
• 期刊代码：6_09698043
• 类别：ce
• 出版时间：July, 2012
• 卷：70
• 期：7
• 页码：1150-1153
• 文件大小：312 K

摘要

A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A 纬-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to a non-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm.