摘要
以氧化钼(MoO_3)、硫(S)和氯化铌(NbCl_5)作为前驱体,利用一锅两步化学气相沉积法,在SiO_2基底上大面积地生长连续性好、均匀负载的Nb-MoS_2薄膜结构。通过扫描电子显微镜(SEM)和原子力显微镜(AFM)表征可知薄层具有较好的连续性,同时使用拉曼光谱(Raman)、光致发光光谱(PL)和X射线光电子能谱(XPS)证实了掺杂后薄膜内部出现高达90 meV的蓝移现象。将薄膜制成场效应管(FET),并对其电学性能进行测试得出,场效应迁移率为1.22 cm~2·V~(-1)·s~(-1),电流开关比为10~5,并证实了当Nb掺杂入MoS_2薄膜后使得薄膜整体阻抗大幅降低,整体阻抗降低到66.67 kΩ,比未掺杂Nb的MoS_2薄膜降低了约40%。本工艺操作简单、成本低、重现率高,为制备高质量、大面积过渡金属掺杂的MoS_2薄膜光电学器件提供了新的途径。
In this study, large-area growth of Nb-MoS_2 layers on SiO_2 substrates using one-pot chemical vapor deposition via two steps was successfully achieved. For the first time, a facile, cost-effective and mass-scalable direct synthesis approach was designed for doping Nb into MoS_2 layers using MoO_3, sulfur(S) and NbCl_5 as precursors. The proposed process allowed retaining the uniformity of large area thin layers which are sui-table for device fabrication. The structural and optical properties of the resulting Nb-MoS_2 layers were systematically investigated. Scanning electron microscope(SEM), atomic force microscope(AFM), Raman, photoluminescence(PL) spectra and X-ray photoelectron spectroscopy(XPS) analyses confirmed the formation of continuous and crystalline few-layers MoS_2 and Nb-MoS_2. An obvious blue-shift of up to 90 meV in photoluminescence peaks was observed for samples with different grain sizes. The electrical properties of the as-prepared materials were evaluated by bottom-gate FETs. A field-effect mobility of 1.22 cm~2·V~(-1)·s~(-1) and a current on/off ratio of 10~5 were obtained. In particular, Nb-MoS_2 prepared by Nb doping greatly reduced the resistance of the film to 66.67 kΩ. These findings provide a novel route towards scaled-up synthesis of high-quality few-layered MoS_2 by transition-metal doping in TMDCs which are suitable for electronic and optoelectronic devices.
引文
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