模拟电路软故障诊断的动态电流测试方法
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摘要
在综合阐述目前各种模拟集成电路故障诊断方法的基础上,针对中小规模模拟集成电路的软故障诊断问题,提出结合小波分析、聚类分析和神经网络的动态电流测试方法。采用动态电流测试方法的同时,对电流中的稳态部分与瞬态部分进行分析处理,提高故障的覆盖率。首先对待测电路的动态电流信号进行小波分解,将各频段相对能量作为故障特征向量;然后对得到的故障特征向量样本集进行聚类分析,改善样本质量,并将聚类后的样本集输入神经网络进行训练,提高神经网络的学习效率。对实例中小规模模拟电路进行软故障诊断仿真实验,取得了较高的故障识别率,验证了所提方法的有效性。
On the basis of comprehensively stating current various fault diagnosis methods for the analog integrated circuit, this paper presents a kind of dynamic current testing method combining wavelet analysis, clustering analysis and the neural network to solve the problem of soft fault diagnosis of the small-scale analog integrated circuit. At the same time of using the dynamic current testing method, it makes analysis and process for the steady-state part and instantaneous part in the current so as to improve fault coverage rate. It firstly conducts wavelet decomposition for the dynamic current signals of the measured circuit and takes relative energy of each frequency band as the fault characteristic vector. Then by means of clustering analysis for the sample set of fault characteristic vector, it has improved sample quality. By inputting samples after clustering into the neural network for training, it could improve study efficiency of the neural network. By means of simulation experiment for soft fault diagnosis on the small-scale analog circuit, it has obtained higher fault identification rate and verified effectiveness of the proposed method.
On the basis of comprehensively stating current various fault diagnosis methods for the analog integrated circuit, this paper presents a kind of dynamic current testing method combining wavelet analysis, clustering analysis and the neural network to solve the problem of soft fault diagnosis of the small-scale analog integrated circuit. At the same time of using the dynamic current testing method, it makes analysis and process for the steady-state part and instantaneous part in the current so as to improve fault coverage rate. It firstly conducts wavelet decomposition for the dynamic current signals of the measured circuit and takes relative energy of each frequency band as the fault characteristic vector. Then by means of clustering analysis for the sample set of fault characteristic vector, it has improved sample quality. By inputting samples after clustering into the neural network for training, it could improve study efficiency of the neural network. By means of simulation experiment for soft fault diagnosis on the small-scale analog circuit, it has obtained higher fault identification rate and verified effectiveness of the proposed method.
引文
[1] 胡梅, 胡列峰, 明德祥. 模拟电路统一软故障诊断的研究[J]. 电子测量与仪器学报, 2013, 27(11):1060-1066. HU Mei, HU Liefeng, MING Dexiang . Study on unified soft fault diagnosis of analog circuits[J]. Journal of Electronic Measurement & Instrument, 2013, 27(11):1060-1066.
[2] 陈晓彬, 郑永强, 孙玉彤. 直流电源系统运行方式及隔离开关状态监视方法[J]. 广东电力, 2017, 30(7):40-45. CHEN Xiaobin, ZHENG Yongqiang, SUN Yutong. Operation mode of DC power source system and state monitoring method for isolating switch[J]. Guangdong Electric Power, 2017, 30(7):40-45.
[3] AMINIAN M, AMINIAN F. A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor[J]. IEEE Transactions on Instrumentation & Measurement, 2007, 56(5):1546-1554.
[4] 何怡刚, 祝文姬, 周炎涛,等. 基于粒子群算法的模拟电路故障诊断方法[J]. 电工技术学报, 2010, 25(6):163-171. HE Yigang, ZHU Wenji, ZHOU Yantao, et al. An analog circuit diagnosis method based on particle swarm optimization algorithm[J]. Transactions of China Electrotechnical Society, 2010, 25(6):163-171.
[5] 胡梅, 樊敏. 基于改进型松散小波神经网络的软故障诊断方法[J]. 仪器仪表学报, 2015, 36(增刊1):242-246. HU Mei, FAN Min. Soft fault diagnosis method based on improved loose wavelet neural network[J]. Chinese Journal of Scientific Instrument, 2015, 36(S1):242-246.
[6] TAN Yanghong, HE Yigang, CUI Chun, et al. A novel method for analog fault diagnosis based on neural networks and genetic algorithms[J]. IEEE Transactions on Instrumentation & Measurement, 2008, 57(11):2631-2639.
[7] YUAN Lifen, HE Yigang, HUANG Jiaoying, et al. A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor[J]. IEEE Transactions on Instrumentation & Measurement, 2010, 59(3):586-595.
[8] PENG Minfang, CHI K T, SHEN Mei, et al. Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data Fusion[J]. Circuits Systems & Signal Processing, 2013, 32(2):525-539.
[9] 唐静远, 师奕兵, 姜丁. 模拟电路故障诊断的邻近支持向量机集成方法[J]. 电子测量与仪器学报, 2010, 24(2):107-112. TANG Jingyuan, SHI Yibing, JIAMG Ding. Analog circuit fault diagnosis using proximal support vector machine ensemble[J]. Journal of Electronic Measurement & Instrument, 2010, 24(2):107-112.
[10] LONG Bing,TIAN Shunlin,WANG Houjun. Feature vector selection method using mahalanobis distance for diagnostics of analog circuits based on LS-SVM[J]. Journal of Electronic Testing, 2012, 28(5):745-755.
[11] 崔江, 王友仁. 一种新颖的基于混合故障字典方法的模拟故障诊断策略[J]. 电工技术学报, 2013, 28(4):272-278. CUI Jiang, WANG Youren. A novel strategy of analog fault diagnosis based on hybrid fault dictionaries[J]. Transactions of China Elec-trotechnical Society, 2013, 28(4):272-278.
[12] 陈绍炜, 吴敏华, 赵帅. 基于PCA和ELM的模拟电路故障诊断[J]. 计算机工程与应用, 2015, 51(11):248-251. CHEN Shaowei, WU Minhuang, ZHAO Shuai . Analog circuit fault diagnosis based on PCA and ELM[J]. Computer Engineering and Applications, 2015, 51(11):248-251.
[13] 廖剑, 史贤俊, 周绍磊,等. 基于局部图嵌入加权罚SVM的模拟电路故障诊断方法[J]. 电工技术学报, 2016, 31(4):28-35. LIAO Jian, SHI Xianjun, ZHOU Shaolei, et al. Analog circuit fault diagnosis based on local graph embedding weighted-penalty SVM[J]. Transactions of China Electrotechnical Society, 2016, 31(4):28-35.
[14] 刘美容, 曾黎, 何怡刚,等. 基于LMD多尺度熵和极限学习机的模拟电路故障诊断[J]. 电子测量与仪器学报, 2017, 31(4):530-536. LIU Meirong, ZENG Li, HE Yigang, et al. Analog circuit fault diagnosis based on LMD multi-scale entropy and extreme learning machine[J]. Journal of Electronic Measurement & Instrument, 2017, 31(4):530-536.
[15] 王承, 陈光, 谢永乐. 基于动态电源电流测试的模拟电路故障诊断[J]. 系统工程与电子技术, 2005, 27(3):413-415. WANG Cheng, CHEN Guangju, XIE Yongle . Fault diagnosis in analog circuits based on dynamic supply current testing[J]. Systems Engineering & Electronics, 2005, 27(3):413-415.
[16] 王承, 陈光, 谢永乐. 基于小波-神经网络的模拟电路IDDT 故障诊断[J]. 仪器仪表学报,2005,26(11):1106-1108. WANG Cheng, CHEN Guangju, XIE Yongle. Fault diagnosis in analog circuits IDDT based on wavelet transform and neural networks[J]. Chinese Journal of Scientific Instrument, 2005, 26(11):1106-1108.
[17] 朱彦卿, 何怡刚, 阳辉. 基于电流测试的混合信号电路故障检测和定位[J]. 系统工程与电子技术, 2007, 29(10):1768-1772. ZHU Yanqing, HE Yigang, YANG Hui . Current testing based fault detection and location for mixed-signal circuit[J]. Systems Engineering & Electronics, 2007, 29(10):1768-1772.
[2] 陈晓彬, 郑永强, 孙玉彤. 直流电源系统运行方式及隔离开关状态监视方法[J]. 广东电力, 2017, 30(7):40-45. CHEN Xiaobin, ZHENG Yongqiang, SUN Yutong. Operation mode of DC power source system and state monitoring method for isolating switch[J]. Guangdong Electric Power, 2017, 30(7):40-45.
[3] AMINIAN M, AMINIAN F. A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor[J]. IEEE Transactions on Instrumentation & Measurement, 2007, 56(5):1546-1554.
[4] 何怡刚, 祝文姬, 周炎涛,等. 基于粒子群算法的模拟电路故障诊断方法[J]. 电工技术学报, 2010, 25(6):163-171. HE Yigang, ZHU Wenji, ZHOU Yantao, et al. An analog circuit diagnosis method based on particle swarm optimization algorithm[J]. Transactions of China Electrotechnical Society, 2010, 25(6):163-171.
[5] 胡梅, 樊敏. 基于改进型松散小波神经网络的软故障诊断方法[J]. 仪器仪表学报, 2015, 36(增刊1):242-246. HU Mei, FAN Min. Soft fault diagnosis method based on improved loose wavelet neural network[J]. Chinese Journal of Scientific Instrument, 2015, 36(S1):242-246.
[6] TAN Yanghong, HE Yigang, CUI Chun, et al. A novel method for analog fault diagnosis based on neural networks and genetic algorithms[J]. IEEE Transactions on Instrumentation & Measurement, 2008, 57(11):2631-2639.
[7] YUAN Lifen, HE Yigang, HUANG Jiaoying, et al. A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor[J]. IEEE Transactions on Instrumentation & Measurement, 2010, 59(3):586-595.
[8] PENG Minfang, CHI K T, SHEN Mei, et al. Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data Fusion[J]. Circuits Systems & Signal Processing, 2013, 32(2):525-539.
[9] 唐静远, 师奕兵, 姜丁. 模拟电路故障诊断的邻近支持向量机集成方法[J]. 电子测量与仪器学报, 2010, 24(2):107-112. TANG Jingyuan, SHI Yibing, JIAMG Ding. Analog circuit fault diagnosis using proximal support vector machine ensemble[J]. Journal of Electronic Measurement & Instrument, 2010, 24(2):107-112.
[10] LONG Bing,TIAN Shunlin,WANG Houjun. Feature vector selection method using mahalanobis distance for diagnostics of analog circuits based on LS-SVM[J]. Journal of Electronic Testing, 2012, 28(5):745-755.
[11] 崔江, 王友仁. 一种新颖的基于混合故障字典方法的模拟故障诊断策略[J]. 电工技术学报, 2013, 28(4):272-278. CUI Jiang, WANG Youren. A novel strategy of analog fault diagnosis based on hybrid fault dictionaries[J]. Transactions of China Elec-trotechnical Society, 2013, 28(4):272-278.
[12] 陈绍炜, 吴敏华, 赵帅. 基于PCA和ELM的模拟电路故障诊断[J]. 计算机工程与应用, 2015, 51(11):248-251. CHEN Shaowei, WU Minhuang, ZHAO Shuai . Analog circuit fault diagnosis based on PCA and ELM[J]. Computer Engineering and Applications, 2015, 51(11):248-251.
[13] 廖剑, 史贤俊, 周绍磊,等. 基于局部图嵌入加权罚SVM的模拟电路故障诊断方法[J]. 电工技术学报, 2016, 31(4):28-35. LIAO Jian, SHI Xianjun, ZHOU Shaolei, et al. Analog circuit fault diagnosis based on local graph embedding weighted-penalty SVM[J]. Transactions of China Electrotechnical Society, 2016, 31(4):28-35.
[14] 刘美容, 曾黎, 何怡刚,等. 基于LMD多尺度熵和极限学习机的模拟电路故障诊断[J]. 电子测量与仪器学报, 2017, 31(4):530-536. LIU Meirong, ZENG Li, HE Yigang, et al. Analog circuit fault diagnosis based on LMD multi-scale entropy and extreme learning machine[J]. Journal of Electronic Measurement & Instrument, 2017, 31(4):530-536.
[15] 王承, 陈光, 谢永乐. 基于动态电源电流测试的模拟电路故障诊断[J]. 系统工程与电子技术, 2005, 27(3):413-415. WANG Cheng, CHEN Guangju, XIE Yongle . Fault diagnosis in analog circuits based on dynamic supply current testing[J]. Systems Engineering & Electronics, 2005, 27(3):413-415.
[16] 王承, 陈光, 谢永乐. 基于小波-神经网络的模拟电路IDDT 故障诊断[J]. 仪器仪表学报,2005,26(11):1106-1108. WANG Cheng, CHEN Guangju, XIE Yongle. Fault diagnosis in analog circuits IDDT based on wavelet transform and neural networks[J]. Chinese Journal of Scientific Instrument, 2005, 26(11):1106-1108.
[17] 朱彦卿, 何怡刚, 阳辉. 基于电流测试的混合信号电路故障检测和定位[J]. 系统工程与电子技术, 2007, 29(10):1768-1772. ZHU Yanqing, HE Yigang, YANG Hui . Current testing based fault detection and location for mixed-signal circuit[J]. Systems Engineering & Electronics, 2007, 29(10):1768-1772.