X射线衍射法测定纳米晶纯铝的平均晶粒尺寸
|
摘要
对放电等离子烧结制备的纳米晶纯铝样品进行了X射线衍射分析,并以完全退火的硅粉末作为标准样品来分离仪器宽化,提出了物理宽化后通过"积分宽度法"计算纳米晶纯铝平均晶粒尺寸的方法。结果表明:试验纯铝样品的平均晶粒尺寸为73.7nm,达到了纳米量级。
X-ray diffraction analysis of the nanocrystalline pure aluminum sample prepared by spark plasma sintering was carried out,and fully annealed silicon powders were used as the standard sample to separate the instrument widening.The method of calculating average grain size of nanocrystalline pure aluminum sample by using‘integral width method'after extracting the physical widening was proposed.The results show that the average grain size of the test pure aluminum sample is 73.7 nm,and it has reached the nanometer scale.
X-ray diffraction analysis of the nanocrystalline pure aluminum sample prepared by spark plasma sintering was carried out,and fully annealed silicon powders were used as the standard sample to separate the instrument widening.The method of calculating average grain size of nanocrystalline pure aluminum sample by using‘integral width method'after extracting the physical widening was proposed.The results show that the average grain size of the test pure aluminum sample is 73.7 nm,and it has reached the nanometer scale.
引文
[1]韩佳玲.X射线衍射分析高能喷丸后45钢的表层晶粒尺寸[J].理化检验(物理分册),2010,46(2):86-88.
[2]伍建文,潘学荣,芦丽莉,等.基于XRD的Inconel 690和321不锈钢异种金属焊接残余应力测试与分析[J].无损检测,2018,40(10):49-52.
[3]张鑫,刘静,李光强,等.XRD与TEM技术在分析纳米金属晶粒尺寸中的应用[J].南方金属,2006(3):15-17,27.
[4]GUINEBRETIRE R.X-ray diffraction by polycrystalline materials[M].[S.l.]:John Wiley&Sons,2007.
[5]ZHANG Z,ZHOU F,LAVERNIA E J.On the analysis of grain size in bulk nanocrystalline materials via X-ray diffraction[J].Metallurgical and Materials Transactions A,2003,34(6):1349-1355.
[6]KLUG H P,ALEXANDER L E.X-ray diffraction procedures for polycrystalline and amorphous materials[M].New York:Wiley-Interscience,1974.
[7]YOUNG R A,WILES D B.Profile shape functions in Rietveld refinements[J].Journal of Applied Crystallography,1982,15(4):430-438.
[2]伍建文,潘学荣,芦丽莉,等.基于XRD的Inconel 690和321不锈钢异种金属焊接残余应力测试与分析[J].无损检测,2018,40(10):49-52.
[3]张鑫,刘静,李光强,等.XRD与TEM技术在分析纳米金属晶粒尺寸中的应用[J].南方金属,2006(3):15-17,27.
[4]GUINEBRETIRE R.X-ray diffraction by polycrystalline materials[M].[S.l.]:John Wiley&Sons,2007.
[5]ZHANG Z,ZHOU F,LAVERNIA E J.On the analysis of grain size in bulk nanocrystalline materials via X-ray diffraction[J].Metallurgical and Materials Transactions A,2003,34(6):1349-1355.
[6]KLUG H P,ALEXANDER L E.X-ray diffraction procedures for polycrystalline and amorphous materials[M].New York:Wiley-Interscience,1974.
[7]YOUNG R A,WILES D B.Profile shape functions in Rietveld refinements[J].Journal of Applied Crystallography,1982,15(4):430-438.