Improvement on the magneto-optical Kerr effect of cobalt film with a quadrilayer structure
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摘要
The magneto-optical Kerr effect of the HfO2 /Co/HfO2 /Al multilayer structure is investigated in this work, and an obvious cavity enhancement of the Kerr response for the HfO2 semiconductor is found both theoretically and experimentally. Surprisingly, a maximum value of about -3 ° of the polar Kerr rotation for s-polarized incident light is observed in our experiment. We propose that this improvement on the Kerr effect can be attributed to the multiple reflection and optical interference in the cavity, which can also be proved by simulation using the finite element method.
The magneto-optical Kerr effect of the HfO2 /Co/HfO2 /Al multilayer structure is investigated in this work, and an obvious cavity enhancement of the Kerr response for the HfO2 semiconductor is found both theoretically and experimentally. Surprisingly, a maximum value of about -3 ° of the polar Kerr rotation for s-polarized incident light is observed in our experiment. We propose that this improvement on the Kerr effect can be attributed to the multiple reflection and optical interference in the cavity, which can also be proved by simulation using the finite element method.
The magneto-optical Kerr effect of the HfO2 /Co/HfO2 /Al multilayer structure is investigated in this work, and an obvious cavity enhancement of the Kerr response for the HfO2 semiconductor is found both theoretically and experimentally. Surprisingly, a maximum value of about -3 ° of the polar Kerr rotation for s-polarized incident light is observed in our experiment. We propose that this improvement on the Kerr effect can be attributed to the multiple reflection and optical interference in the cavity, which can also be proved by simulation using the finite element method.
引文
[1]Ferreiro-Vila E,Gonza′lez-D′az J B,Fermento R,Gonza′lez M U,Garc′a-Mart′n A,Garc′a-Mart′n J M,Cebollada A and Armelles G2009Phys.Rev.B80125132
[2]Yin J H,Takao S and Pan L Q2008Chin.Phys.B173907
[3]Kravets V G and Lapchuk A S2010Appl.Opt.495013
[4]Wang H,Zhou Y S,Chen J C,Li T,Zhao H W,Zhan W S,Wang S Y and Chen L Y2001Chin.Phys.Lett.181117
[5]Zou Z Q and Liu G Q2004Appl.Phys.A78711
[6]Postava K,Sveklo I,Tekielak M,Mazalski P,Maziewski A,Stu-pakiewicz A,Urbaniak M,Szyman′ski B and Stobiecki F2008IEEE T.Magn.443261
[7]Atkinson R,Salter I W and Xu J1992Appl.Opt.314847
[8]Moradi M and Ghanaatshoar M2010Opt.Commun.2835053
[9]Hendren W R,Atkinson R,Pollard R J,Salter I W,Wright C D,Clegg W W and Jenkins D F L2003J.Phys.:Condens.Matter151461
[10]Wang S,Barman A,Schmidt H,Maas J D,Hawkins A R,Kwon S,Harteneck B,Cabrini S and Bokor J2007Appl.Phys.Lett.90252504
[11]Barman A,Wang S Q,Maas J D,Hawkins A R,Kwon S,Liddle A,Bokor J and Schmidt H2006Nano Lett.62939
[12]Qureshi N,Wang S Q,Lowther M A,Hawkins A R,Kwon S,Liddle A,Bokor J and Schmidt H2005Nano Lett.51413
[13]Qiu Z Q and Bader S D2000Rev.Sci.Instrum.711243
[14]Qureshi N and Schmidt H2004Appl.Phys.Lett.85431
[15]Fu H,Yan Z,Lee S K and Mansuripur M1995J.Appl.Phys.784076
[16]Osgood III R M,Riggs K T,Johnson A E,Mattson J E,Sowers C H and Bader S D1997Phys.Rev.B562627
[17]http://refractiveindex.info/
[18]Liu Y M,Bartal G and Zhang X2008Opt.Express1615439
[19]Gao Y,Huang J P,Liu Y M,Gao L,Yu K W and Zhang X2010Phys.Rev.Lett.104034501
[20]Zhang S P,Wei H,Bao K,Hakanson U,Halas N J,Nordlander P and Xu H X2011Phys.Rev.Lett.107096801
[2]Yin J H,Takao S and Pan L Q2008Chin.Phys.B173907
[3]Kravets V G and Lapchuk A S2010Appl.Opt.495013
[4]Wang H,Zhou Y S,Chen J C,Li T,Zhao H W,Zhan W S,Wang S Y and Chen L Y2001Chin.Phys.Lett.181117
[5]Zou Z Q and Liu G Q2004Appl.Phys.A78711
[6]Postava K,Sveklo I,Tekielak M,Mazalski P,Maziewski A,Stu-pakiewicz A,Urbaniak M,Szyman′ski B and Stobiecki F2008IEEE T.Magn.443261
[7]Atkinson R,Salter I W and Xu J1992Appl.Opt.314847
[8]Moradi M and Ghanaatshoar M2010Opt.Commun.2835053
[9]Hendren W R,Atkinson R,Pollard R J,Salter I W,Wright C D,Clegg W W and Jenkins D F L2003J.Phys.:Condens.Matter151461
[10]Wang S,Barman A,Schmidt H,Maas J D,Hawkins A R,Kwon S,Harteneck B,Cabrini S and Bokor J2007Appl.Phys.Lett.90252504
[11]Barman A,Wang S Q,Maas J D,Hawkins A R,Kwon S,Liddle A,Bokor J and Schmidt H2006Nano Lett.62939
[12]Qureshi N,Wang S Q,Lowther M A,Hawkins A R,Kwon S,Liddle A,Bokor J and Schmidt H2005Nano Lett.51413
[13]Qiu Z Q and Bader S D2000Rev.Sci.Instrum.711243
[14]Qureshi N and Schmidt H2004Appl.Phys.Lett.85431
[15]Fu H,Yan Z,Lee S K and Mansuripur M1995J.Appl.Phys.784076
[16]Osgood III R M,Riggs K T,Johnson A E,Mattson J E,Sowers C H and Bader S D1997Phys.Rev.B562627
[17]http://refractiveindex.info/
[18]Liu Y M,Bartal G and Zhang X2008Opt.Express1615439
[19]Gao Y,Huang J P,Liu Y M,Gao L,Yu K W and Zhang X2010Phys.Rev.Lett.104034501
[20]Zhang S P,Wei H,Bao K,Hakanson U,Halas N J,Nordlander P and Xu H X2011Phys.Rev.Lett.107096801