电子散斑相关技术及其在工程检测中的应用研究
摘要
在工程材料力学中,变形后的梁弯曲轴线称为挠曲轴线,简称挠曲线。它反映了材料的力学性质,是研究材料特性的重要参数。对梁挠曲线测量研究时,由于弯曲度小,无法用常规的方法进行测量,因此常用激光全息法,但此方法不仅需要显影、定影等湿处理手段,还需要暗房操作等条件,限制了光学检测技术在实际工程中的应用。
本文根据电子散斑相关技术具有实时、全场、快速、无须暗房操作等特点。首先,将电子散斑干涉技术应用到研究梁的形变位移测量中,实现了光学检测技术由实验走向实际应用,但由于它对测量环境的抗干扰能力较低,给实时检测带来了影响。因此,本文主要阐述了电子剪切散斑干涉测量技术,介绍它的系统组成与测量原理,分析研究了剪切散斑中各种位相测量的方法,并讨论了在不同测量条件下各方法对精度的影响。
其次,将电子剪切散斑干涉技术应用到实验研究中,分别运用电子剪切散斑干涉技术时间相移法和空间载波Fourier变换法对典型试件的位移导数场进行求解,将实验结果与理论值进行比较分析,证实了电子剪切散斑干涉技术空间载波Fourier变换法在实际检测中不仅具有近似于时间相移法的精度,还显示出其动态测量的优势。
第三,分别将电子散斑相关技术应用到实际工程材料力学检测中。应用电子散斑干涉技术时间相移法对梁形变的位移场进行测量,并与理论解进行比较分析。应用电子剪切散斑干涉技术时间相移法、空间载波Fourier变换法对梁形变的位移导数场进行测定,得出了其形变位移导数场分布图,通过与理论计算数值的比较分析,进一步显示了电子剪切散斑干涉技术空间载波Fourier变换法作为一种实用的测量方法,将会在工业检测中获得广泛的应用。
The deformation of beam bending axis(deflection) is an important parameter that reflects the mechanical properties of material. However, it is not convenient to measure the parameter by normal measuring method because of its less bending percentage. Usually, it is measured by the laser holography method. The method needs not only humidity processing, but also darkroom operation. Therefore, the application of the laser holography method is limited in the engineering practice.
First of all, according to the real-time, whole-field and fast character of the related technology of Electric Speckle Pattern Interferometry (ESPI), the ESPI is used to measure the deformation displacement of beam and make the optical detection technology be used in the practical application. But the influence of environment vibration to the measurement errors is big. So the principle of Electric Shearography Speckle Pattern Interferometry(ESSPI) is stated briefly in this paper. Its system composition and measurement theory was introduced, and all of these phase measuring methods in ESSPI and the influence to the precision of these phase measuring methods was discussed.
Then, the ESSPI was used in the experimental research. The temporal phase-shift method(TPM) and Spatial carrier Fourier transform method(SCFTM) of ESSPI were used to solve the differential field of displacement of the edge-clamped round board respectively. Comparing the experimental result with the theoretical result, which proves that the Spatial carrier Fourier transform method is much more superiority in dynamic inspection and has approximate precision to the temporal phase-shift method.
At the last, the related technology of Electric Speckle Pattern Interferometry was used in the engineering material mechanics measurement respectively. The temporal phase-shift method of ESPI was used to measure the displacement of deformation of the beam. Its result was compared with the theoretical. And then the temporal phase-shift method and Spatial carrier Fourier transform method of ESSPI were used to measure the displacement gradient of deformation of the beam. By comparing with the theoretical results, the experimental results show that Spatial carrier Fourier transform method is a very useful measuring method and may be widely used in the engineering application.
本文根据电子散斑相关技术具有实时、全场、快速、无须暗房操作等特点。首先,将电子散斑干涉技术应用到研究梁的形变位移测量中,实现了光学检测技术由实验走向实际应用,但由于它对测量环境的抗干扰能力较低,给实时检测带来了影响。因此,本文主要阐述了电子剪切散斑干涉测量技术,介绍它的系统组成与测量原理,分析研究了剪切散斑中各种位相测量的方法,并讨论了在不同测量条件下各方法对精度的影响。
其次,将电子剪切散斑干涉技术应用到实验研究中,分别运用电子剪切散斑干涉技术时间相移法和空间载波Fourier变换法对典型试件的位移导数场进行求解,将实验结果与理论值进行比较分析,证实了电子剪切散斑干涉技术空间载波Fourier变换法在实际检测中不仅具有近似于时间相移法的精度,还显示出其动态测量的优势。
第三,分别将电子散斑相关技术应用到实际工程材料力学检测中。应用电子散斑干涉技术时间相移法对梁形变的位移场进行测量,并与理论解进行比较分析。应用电子剪切散斑干涉技术时间相移法、空间载波Fourier变换法对梁形变的位移导数场进行测定,得出了其形变位移导数场分布图,通过与理论计算数值的比较分析,进一步显示了电子剪切散斑干涉技术空间载波Fourier变换法作为一种实用的测量方法,将会在工业检测中获得广泛的应用。
The deformation of beam bending axis(deflection) is an important parameter that reflects the mechanical properties of material. However, it is not convenient to measure the parameter by normal measuring method because of its less bending percentage. Usually, it is measured by the laser holography method. The method needs not only humidity processing, but also darkroom operation. Therefore, the application of the laser holography method is limited in the engineering practice.
First of all, according to the real-time, whole-field and fast character of the related technology of Electric Speckle Pattern Interferometry (ESPI), the ESPI is used to measure the deformation displacement of beam and make the optical detection technology be used in the practical application. But the influence of environment vibration to the measurement errors is big. So the principle of Electric Shearography Speckle Pattern Interferometry(ESSPI) is stated briefly in this paper. Its system composition and measurement theory was introduced, and all of these phase measuring methods in ESSPI and the influence to the precision of these phase measuring methods was discussed.
Then, the ESSPI was used in the experimental research. The temporal phase-shift method(TPM) and Spatial carrier Fourier transform method(SCFTM) of ESSPI were used to solve the differential field of displacement of the edge-clamped round board respectively. Comparing the experimental result with the theoretical result, which proves that the Spatial carrier Fourier transform method is much more superiority in dynamic inspection and has approximate precision to the temporal phase-shift method.
At the last, the related technology of Electric Speckle Pattern Interferometry was used in the engineering material mechanics measurement respectively. The temporal phase-shift method of ESPI was used to measure the displacement of deformation of the beam. Its result was compared with the theoretical. And then the temporal phase-shift method and Spatial carrier Fourier transform method of ESSPI were used to measure the displacement gradient of deformation of the beam. By comparing with the theoretical results, the experimental results show that Spatial carrier Fourier transform method is a very useful measuring method and may be widely used in the engineering application.
引文
[1]戴蓉.激光技术在无损检测领域的应用与发展[J].激光与光电子学进展,2000,414(6):1-4
[2]郑光昭.电子散斑干涉术[J].广东工业大学学报,2002,19(3):11-13
[3]刘龙,孟光.电子散斑干涉无损检测技术的应用现状[J].无损检测,2006,28(1):28-30
[4]Archbold E.and Burch J.M.Recording of in-plane surface displacement by double exposure speckle photography.Opt.Acta[J],1970.17:883-898
[5]Leendertz JA.Interferometric displacement measurement on scattering surfaces using speckle effects.J.Physics E[J],1970,3:214-218
[6]Lokberg J.and Hogmoen K.Vibration phase mapping using electronic speckle pattern interferometry.Appl.Opt.[J],1976,15:2701-2716
[7]Jones R.and Wykes G.General parameters for the design and optimization of electronic speckle patter interferometry.Opt.Acta[J],1981,28(7):949-972
[8]Jones R.and Wykes G.General parameters for the design and optimization of electronic speckle patter interferometry.Opt.Acta[J],1981,28(7):949-972
[9]秦玉文,戴嘉彬,陈金龙.电子散斑方法的进展[J].实验力学,1996,11(4):411-416
[10]N.Krishna Mohan,P.K.Rastogi.Recent developments in digital speckle pattern interferometry[J].Opt.Lasers Eng.,2003,40:439-450
[11]R.Jones and C.Wykes.Holographic and Speckle Interferometry[J].London:Cambridge Univ.press,1983
[12]J.A.Leendertz.Interferometric displacement measurement on scattering surfaces utilizing speckle effect[J].J.Phys.E(Scient.Instrum),1970,3:214-218
[13]Y.Y.Hung and C.Y.Liang.Image-sheafing camera for direct measurement of surface strains[J].Appl.Opt.,1979,18:1046
[14]A.Macovski and S.D.Ramsey.Time-lapse interferometry and contouring using television syetem[J].Appl.Opt.,1971,10(12):2722-2727
[15]H.M.Peterson.Holographic vibration measurement using a TV speckle interferometer with silicon target vidicon[J].Opt.Commun.,1974,12:421-426
[16]O.J.Lokberg and K.Hogmoen.Vibration phase mapping using electronic speckle pattern interferomety[J].Appl.Opt.,1976,15(11):2701-2716
[17]R.Jones and G.Wykes.Opt.ACTA.,1978,25(6):449-472
[18]S.Nakadate,T.Yatagai and H.saito.Electronic speckle pattern interferometry using digital image processing technique[J].Appl.Opt.,1980,19(11):1879-1883
[19]Y.Y.Hung and C.E.Taylor.Speckle sheafing interferometric camera:a tool for measurementof derivatives of surface displacement[J].Proc.SPIE.,1973,41:169-175
[20]Y.W.Qin and J.B.Dai.Real-time interval technique on electronic sheafing speckle pattern interferometry[J].Optics Lasers in Eng.,1994,20(5):241-248
[21]孙平.三维位移场检测及其时间与空间相移技术在船用柴油机上应用研究 [D].上海重国船舶研究院博士学位论文,2003
[22]钱克矛.光学干涉计量中的位相测量方法研究[D].合肥:中国科技大学博士学位论文,2000
[23]B.Kemper,D.Dirksen,W.Avenhaus,A.Merker,G..von Bally.Endoscopic double-pulse electronic speckle-pattern interferometer(ESPI)for technical and medical intra cavity inspection[J].Appl.Opt.,2000,39(22):3899-3905
[24]A.Svanbro,J.M.Huntley,A.Davila.Optimal re-referencing rating for in plane dynamic speckle interferometry[J].Applied Optics,2003,42(2):251-258
[25]Jingwei Tong.Automatic analysis of three-dimensional displacement field using ESPI[J].Optical and Lasers in Engineering,1997,26(6):515-529
[26]A.Gundlach,J.M.Huntley,B.Manzke.Speckle shearing interferometry using a diffractive optical beamsplitter[J].Opt.Eng.,1997,36:1488-1493
[27]P.A.Fomitchov,S.Kfishnaswamy,A compact dual-purpose camera for shearography and electronic speckle-pattern interferometry[J].Meas Sci Technol 1997,8:581-358
[28]T.W.Ng.Digital speckle pattern interferometer for combined measurements of out-of-plane displacement and slope[J].Opt.Commun.,1995,116:31-35
[29]W.C.Wang,C.H.Day,C.H.Huang and T.B.Chiou.Nondestructive testing of composite materials by ESPI[J].Proc.ATEM conf on Exp.Mech.,1993,179-184
[30]G.T.Reid.Automatic fringe pattern analysis[J].Optics and Lasers in Engineering,1987,7(1):37-68
[31]钱克予,缪泓,伍小平.一种用于动态过程测量的实时偏振相移方法[J].光学学报,2001,21(1):64-65
[32]C.C.Kao,G..B.Yeh,S.S.Lee,C.K.Lee,C.S.Yang,K.C.Wu.Phase shifting algorithm for electronic speckle pattern interferometry[J].Appl.Opt.,2002.41:46-54
[33]史红民,王浩,陆耀东等.错位相移技术研究[J].光电子.激光,1998,9(2):124-126
[34]W.S.Wan abdullah,J.N.Petzing,J.R.Tyrer.Wavefront divergence:a source of error in quantified speckle shearing data[J].Journal of Modern Optics,2001,48(5):757-772
[35]J.M.Huntley.Automated fringe pattern analysis in experimental mechanics:a review[J].J of Strain Analysis,1998,33(2):105-125
[36]陆鹏,张熹.一种新的相移电子剪切散斑方法在离面位移梯度场测量中的应用[J].实验力学,2005(12)2:287-290
[37]张熹,孙平,金华.三维电子散斑干涉法在检测残余应力中的应用[J].实验力学,2000,15(2):126-131
[38]王晓凤.剪切散斑相移技术研究[D],山东.山东师范大学硕士学位文论文(2007)
[39]孙平,张熹.电子散斑干涉中相移技术的研究[J].光电子激光,2001,12(11):1174-1176
[40]戴嘉彬.用相移电子剪切散斑技术进行离面位移的测量[J],河北工程技术高等专科学校学报,1992(2):20-24
[41]方强,陈家壁.全息散斑计量学[M].北京:科学出版社,1995
[42]曹根瑞,梅文辉,王晓晖.一种新的移相干涉技术[J].光学技术,1996(1),2-7
[43]伍小平,何世平,李志超.空间散斑的运动规律[J].物理学报,1980,9:52-60
[44]D.W.Robinson,G.T.Reid.Interferogram Analysis[M].Institute of Physics Publishing,1993
[45]顾德门,詹达三,董经武译.傅立叶光学导论[M].科学出版社,1979
[46]Sun Ping,Tao Chunxian,Zhang Li,et al.Spatial modulation for electronic speckle patterns and its demodulation[J].Optoelectronics Lett.,2005,1(2):141-143
[47]L.Merts.Real-time fringe-pattern analysis[J].Appl.Opt.,1983,22(10):1535-1539
[48]Kujaw inska M.Spatial carder phase shifting technique of fringe pattern analysis[J].SPIE.1991,1508(2):61-67
[49]刘廷瑞,赵永瑞,陈广庆.空间载波相移法理论研究[J].光学仪器,2004,26(5):26-30
[50]张以漠.应用光学[M].北京:机械工业出版社,1982.2
[51]陈振翌,马铁军,陈育彬,李金贤.剪切电子散斑干涉技术在轮胎缺陷检测中的应用[J].橡胶工业,2006,53(8):501-502
[52]李庆华.材料力学[M].成都:西南交通大学出版社,2005.2
[53]朱晨,刘永胜,宋淑萍,徐舟.金属梁挠度的激光全息再现[J].激光技术,2004,28(3):297-302
[54]王秋芬.利用激光全息干涉测量梁的微小位移[J].物理实验.2006(26)8:8-12
[2]郑光昭.电子散斑干涉术[J].广东工业大学学报,2002,19(3):11-13
[3]刘龙,孟光.电子散斑干涉无损检测技术的应用现状[J].无损检测,2006,28(1):28-30
[4]Archbold E.and Burch J.M.Recording of in-plane surface displacement by double exposure speckle photography.Opt.Acta[J],1970.17:883-898
[5]Leendertz JA.Interferometric displacement measurement on scattering surfaces using speckle effects.J.Physics E[J],1970,3:214-218
[6]Lokberg J.and Hogmoen K.Vibration phase mapping using electronic speckle pattern interferometry.Appl.Opt.[J],1976,15:2701-2716
[7]Jones R.and Wykes G.General parameters for the design and optimization of electronic speckle patter interferometry.Opt.Acta[J],1981,28(7):949-972
[8]Jones R.and Wykes G.General parameters for the design and optimization of electronic speckle patter interferometry.Opt.Acta[J],1981,28(7):949-972
[9]秦玉文,戴嘉彬,陈金龙.电子散斑方法的进展[J].实验力学,1996,11(4):411-416
[10]N.Krishna Mohan,P.K.Rastogi.Recent developments in digital speckle pattern interferometry[J].Opt.Lasers Eng.,2003,40:439-450
[11]R.Jones and C.Wykes.Holographic and Speckle Interferometry[J].London:Cambridge Univ.press,1983
[12]J.A.Leendertz.Interferometric displacement measurement on scattering surfaces utilizing speckle effect[J].J.Phys.E(Scient.Instrum),1970,3:214-218
[13]Y.Y.Hung and C.Y.Liang.Image-sheafing camera for direct measurement of surface strains[J].Appl.Opt.,1979,18:1046
[14]A.Macovski and S.D.Ramsey.Time-lapse interferometry and contouring using television syetem[J].Appl.Opt.,1971,10(12):2722-2727
[15]H.M.Peterson.Holographic vibration measurement using a TV speckle interferometer with silicon target vidicon[J].Opt.Commun.,1974,12:421-426
[16]O.J.Lokberg and K.Hogmoen.Vibration phase mapping using electronic speckle pattern interferomety[J].Appl.Opt.,1976,15(11):2701-2716
[17]R.Jones and G.Wykes.Opt.ACTA.,1978,25(6):449-472
[18]S.Nakadate,T.Yatagai and H.saito.Electronic speckle pattern interferometry using digital image processing technique[J].Appl.Opt.,1980,19(11):1879-1883
[19]Y.Y.Hung and C.E.Taylor.Speckle sheafing interferometric camera:a tool for measurementof derivatives of surface displacement[J].Proc.SPIE.,1973,41:169-175
[20]Y.W.Qin and J.B.Dai.Real-time interval technique on electronic sheafing speckle pattern interferometry[J].Optics Lasers in Eng.,1994,20(5):241-248
[21]孙平.三维位移场检测及其时间与空间相移技术在船用柴油机上应用研究 [D].上海重国船舶研究院博士学位论文,2003
[22]钱克矛.光学干涉计量中的位相测量方法研究[D].合肥:中国科技大学博士学位论文,2000
[23]B.Kemper,D.Dirksen,W.Avenhaus,A.Merker,G..von Bally.Endoscopic double-pulse electronic speckle-pattern interferometer(ESPI)for technical and medical intra cavity inspection[J].Appl.Opt.,2000,39(22):3899-3905
[24]A.Svanbro,J.M.Huntley,A.Davila.Optimal re-referencing rating for in plane dynamic speckle interferometry[J].Applied Optics,2003,42(2):251-258
[25]Jingwei Tong.Automatic analysis of three-dimensional displacement field using ESPI[J].Optical and Lasers in Engineering,1997,26(6):515-529
[26]A.Gundlach,J.M.Huntley,B.Manzke.Speckle shearing interferometry using a diffractive optical beamsplitter[J].Opt.Eng.,1997,36:1488-1493
[27]P.A.Fomitchov,S.Kfishnaswamy,A compact dual-purpose camera for shearography and electronic speckle-pattern interferometry[J].Meas Sci Technol 1997,8:581-358
[28]T.W.Ng.Digital speckle pattern interferometer for combined measurements of out-of-plane displacement and slope[J].Opt.Commun.,1995,116:31-35
[29]W.C.Wang,C.H.Day,C.H.Huang and T.B.Chiou.Nondestructive testing of composite materials by ESPI[J].Proc.ATEM conf on Exp.Mech.,1993,179-184
[30]G.T.Reid.Automatic fringe pattern analysis[J].Optics and Lasers in Engineering,1987,7(1):37-68
[31]钱克予,缪泓,伍小平.一种用于动态过程测量的实时偏振相移方法[J].光学学报,2001,21(1):64-65
[32]C.C.Kao,G..B.Yeh,S.S.Lee,C.K.Lee,C.S.Yang,K.C.Wu.Phase shifting algorithm for electronic speckle pattern interferometry[J].Appl.Opt.,2002.41:46-54
[33]史红民,王浩,陆耀东等.错位相移技术研究[J].光电子.激光,1998,9(2):124-126
[34]W.S.Wan abdullah,J.N.Petzing,J.R.Tyrer.Wavefront divergence:a source of error in quantified speckle shearing data[J].Journal of Modern Optics,2001,48(5):757-772
[35]J.M.Huntley.Automated fringe pattern analysis in experimental mechanics:a review[J].J of Strain Analysis,1998,33(2):105-125
[36]陆鹏,张熹.一种新的相移电子剪切散斑方法在离面位移梯度场测量中的应用[J].实验力学,2005(12)2:287-290
[37]张熹,孙平,金华.三维电子散斑干涉法在检测残余应力中的应用[J].实验力学,2000,15(2):126-131
[38]王晓凤.剪切散斑相移技术研究[D],山东.山东师范大学硕士学位文论文(2007)
[39]孙平,张熹.电子散斑干涉中相移技术的研究[J].光电子激光,2001,12(11):1174-1176
[40]戴嘉彬.用相移电子剪切散斑技术进行离面位移的测量[J],河北工程技术高等专科学校学报,1992(2):20-24
[41]方强,陈家壁.全息散斑计量学[M].北京:科学出版社,1995
[42]曹根瑞,梅文辉,王晓晖.一种新的移相干涉技术[J].光学技术,1996(1),2-7
[43]伍小平,何世平,李志超.空间散斑的运动规律[J].物理学报,1980,9:52-60
[44]D.W.Robinson,G.T.Reid.Interferogram Analysis[M].Institute of Physics Publishing,1993
[45]顾德门,詹达三,董经武译.傅立叶光学导论[M].科学出版社,1979
[46]Sun Ping,Tao Chunxian,Zhang Li,et al.Spatial modulation for electronic speckle patterns and its demodulation[J].Optoelectronics Lett.,2005,1(2):141-143
[47]L.Merts.Real-time fringe-pattern analysis[J].Appl.Opt.,1983,22(10):1535-1539
[48]Kujaw inska M.Spatial carder phase shifting technique of fringe pattern analysis[J].SPIE.1991,1508(2):61-67
[49]刘廷瑞,赵永瑞,陈广庆.空间载波相移法理论研究[J].光学仪器,2004,26(5):26-30
[50]张以漠.应用光学[M].北京:机械工业出版社,1982.2
[51]陈振翌,马铁军,陈育彬,李金贤.剪切电子散斑干涉技术在轮胎缺陷检测中的应用[J].橡胶工业,2006,53(8):501-502
[52]李庆华.材料力学[M].成都:西南交通大学出版社,2005.2
[53]朱晨,刘永胜,宋淑萍,徐舟.金属梁挠度的激光全息再现[J].激光技术,2004,28(3):297-302
[54]王秋芬.利用激光全息干涉测量梁的微小位移[J].物理实验.2006(26)8:8-12