变温辐照对双极电压比较器LM2903在不同偏置状态下的单粒子瞬态影响
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摘要
利用变温辐照方法模拟了低剂量率辐照,研究了双极电压比较器LM2903的电离总剂量(TID)-单粒子瞬态(SET)的协同效应。结果表明,高电平工作状态偏置时,TID对LM2903的SET具有抑制作用;低电平工作状态偏置时,TID对LM2903的SET具有促进作用。电离辐照诱发的界面态缺陷电荷是TID-SET协同效应产生的根本原因,电压比较器的输出级结构导致了偏置状态对TID-SET协同效应的不同影响。
The synergistic effect of total ionizing dose(TID) and single event transient(SET) in bipolar voltage comparator LM2903 was studied by temperature switching irradiation method which can simulate low-dose-rate irradiation. The result shows that TID has a suppressing effect on the SET of LM2903 at the high-level working state for bias voltage, and TID can promote the SET of LM2903 at the low-level working state for bias voltage. The interface state defect charge induced by ionizing irradiation is the fundamental cause of the synergistic effect of TID-SET. The output stage structure of voltage comparator causes different effects of the bias state on the synergistic effect of TID-SET.
The synergistic effect of total ionizing dose(TID) and single event transient(SET) in bipolar voltage comparator LM2903 was studied by temperature switching irradiation method which can simulate low-dose-rate irradiation. The result shows that TID has a suppressing effect on the SET of LM2903 at the high-level working state for bias voltage, and TID can promote the SET of LM2903 at the low-level working state for bias voltage. The interface state defect charge induced by ionizing irradiation is the fundamental cause of the synergistic effect of TID-SET. The output stage structure of voltage comparator causes different effects of the bias state on the synergistic effect of TID-SET.
引文
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[5] FLEETWOOD D M.Total ionizing dose effects in MOS and low-dose-rate-sensitive linear-bipolar devices[J].IEEE Transactions on Nuclear Science,2013,60(3):1 706-1 730.
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[7] 费武雄,陆妩,任迪远,等.变温辐照加速评估方法在不同工艺的NPN双极晶体管上的应用[J].原子能科学技术,2010,44(12):1 493-1 497.FEI Wuxiong,LU Wu,REN Diyuan,et al.Application of accelerated simulation method on NPN bipolar transistors of different technology[J].Atomic Energy Science and Technology,2010,44(12):1 493-1 497(in Chinese).
[8] 邓伟,陆妩,郭旗,等.变温恒剂量率辐照加速评估方法在双极线性稳压器LM317上的应用[J].原子能科学技术,2014,48(4):727-733.DENG Wei,LU Wu,GUO Qi,et al.Application of accelerated evaluation method of alteration temperature and constant dose rate irradiation on bipolar linear regulator LM317[J].Atomic Energy Science and Technology,2014,48(4):727-733(in Chinese).
[9] 马武英,陆妩,郭旗,等.双极电压比较器低剂量率辐照损伤增强效应的变温辐照加速评估方法[J].原子能科学技术,2014,48(11):2 170-2 176.MA Wuying,LU Wu,GUO Qi,et al.Accelerated evaluation method of temperature switching irradiation for ELDRS of bipolar voltage comparator[J].Atomic Energy Science and Technology,2014,48(11):2 170-2 176(in Chinese).
[10] ZHENG Yuzhan,LU Wu,REN Diyuan,et al.A new accelerated method for evaluating the ELDRS of bipolar operational amplifiers temperature switching approach[C]∥Radiation and Its Effects on Components and Systems.UK:IEEE,2013.
[11] LI Xiaolong,LU Wu,MA Wuying,et al.Use of temperature-switching approach to evaluate the ELDRS of bipolar devices[C]//Radiation and Its Effects on Components and Systems.Germany:IEEE,2016.
[12] BUCHNER S,MCMORROW D,BERNARD M,et al.Total dose effects on error rates in linear bipolar systems[J].IEEE Transactions on Nuclear Science,2008,55(4):2 055-2 062.
[13] ROIG F,DUSSEAU L,RIBEIRO P,et al.The role of feedback resistors and TID effects in the ASET response of a high speed current feedback amplifier[J].IEEE Transactions on Nuclear Science,2014,61(6):3 201-3 209.
[14] ROCHE N J H,BUCHNER S P,KHACHATRIAN A,et al.Impact of cumulative irradiation degradation and circuit board design on the parameters of ASETs induced in discrete BJT-based circuits[J].IEEE Transactions on Nuclear Science,2015,62(6):2 732-2 742.
[15] LI Xiaolong,LU Wu,WANG Xin,et al.Using of temperature-switching approach to evaluate the ELDRS of bipolar devices[J].Radiation Effects & Defects in Solids,2018,172(11-12):824-834.
[16] BERNARD M F,DUSEAU L,BUCHNER S,et al.Impact of total ionizing dose on the analog single event transient sensitivity of a linear bipolar integrated circuit[J].IEEE Transactions on Nuclear Science,2007,54(6):2 534-2 540.