离散元法在绝缘子动态积污分析中的应用
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  • 英文篇名:Application of discrete element method in analysis of dynamic contamination of insulators
  • 作者:王国志 ; 孙海振 ; 吴文海 ; 柯坚
  • 英文作者:WANG Guozhi;SUN Haizhen;WU Wenhai;KE Jian;School of Mechanical Engineering,Southwest Jiaotong University;
  • 关键词:绝缘子 ; 动态积污 ; DEM-CFD耦合方法 ; 颗粒粘附速率
  • 英文关键词:insulator;;dynamic contamination;;DEM-CFD method coupling method;;particle adhesion rate
  • 中文刊名:FTJS
  • 英文刊名:China Powder Science and Technology
  • 机构:西南交通大学机械工程学院;
  • 出版日期:2017-06-28 17:14
  • 出版单位:中国粉体技术
  • 年:2017
  • 期:v.23;No.128
  • 语种:中文;
  • 页:FTJS201703002
  • 页数:5
  • CN:03
  • ISSN:37-1316/TU
  • 分类号:17-21
摘要
为研究外界因素对绝缘子表面的动态积污的影响,以ZS-35KV/6-8瓷棒形支柱绝缘子为研究对象,利用DEM-CFD耦合方法模拟绝缘子表面动态积污过程,使用离散元法综合分析粒径、风速大小、来流角度对积污的影响。结果表明:一定时间内,绝缘子的表面积污率表面粘附的污秽颗粒数呈线性增长趋势;随着风速的增大,颗粒粘附速率先增大,然后逐渐减少,粘附速率最大时对应的风速为最适合积污风速,最适积污风速随粒径的增大近似呈对数分布;当来流角度为135°左右时,颗粒粘附速率最大;绝缘子上表面积污受曳力影响较大,下表面积污受重力沉降作用影响较大,上表面污秽颗粒平均粒径比下表面污秽颗粒平均粒径较小。
        In order to study the influence of external factors on the insulator dynamic contamination, the contamination process of ZS-35KV/6-8 solid core post insulator were studied using coupled methods of DEM and CFD, the effects of particle diameter, wind speed, coming angle of wind on contamination were investigated using discrete element method. The results show that in a certain period of time, the polluting area rate and the number of dirty particles adhered to the surface shows a linear increasing trend. The particle adhesion rate increases initially and then decreases gradually with the increase of wind speed. When the adhesion rate reaches the maximum, it has the optimum wind speed for pollution which showes a logarithmic distribution with the increase of particle diameter. When the coming angle is about 135 °, the pollution is the fastest. The contamination of upper surface is mainly influenced by free stream drag, and the contamination of lower surface is affected by gravity sedimentation most, then the average diameter of particles on the upper surface is smaller than that of particles on the lower surface.
引文
[1]FARZANEH M.覆冰与污秽绝缘子[M].北京:机械工业出版社,2014.
    [2]SU H,JIA Z,GUAN Z,et al.Mechanism of contaminant accumulation and flashover of insulator in heavily polluted coastal area[J].IEEE Transactions on Dielectrics&Electrical Insulation,2010,17(5):1635-1641.
    [3]张锐,黄道春,吴光亚,等.1000 k V支柱瓷绝缘子自然积污规律试验研究[J].高电压技术,2015,41(11):3679-3686.
    [4]卢明,李瑶琴,李黎,等.基于归一比较法的绝缘子积污特性研究[J].高电压技术,2014,40(11):3374-3380.
    [5]唐秋明,毛东,高强.高压绝缘子动态积污机理的研究[C]//2014颗粒材料计算力学会议论文集,兰州,中国力学学会,2014.
    [6]屠幼萍,孙佑飞,彭庆军,等.雾霾环境下自然积污绝缘子的污秽颗粒粒径分布特性[J].高电压技术,2014,40(11):3318-3326.
    [7]FARZANEH M.Insulator flashover under icing condition s[J].IEEETransactions on Dielectrics&Electrical Insulation,2014,21(5):1997-2011.
    [8]王晶,李燕,梁曦东,等.利用原子力显微镜探究污秽颗粒在绝缘子表面的粘附力[J].高电压技术,2013,39(6):1352-1359.
    [9]HORENSTEIN M N,MELCHER J R.Particle contamination of high voltage DC insulators below corona threshold[J].IEEE Transactions on Electrical Insulation,1980,EI-14(6):297-305.
    [10]李恒真,赖江宇,雷乾,等.污秽颗粒在绝缘表面的碰撞和吸附[J].高电压技术,2012,38(10):2596-2603.
    [11]蒋兴良,李海波.计算流体力学在绝缘子积污特性分析中的应用[J].高电压技术,2010,36(2):329-334.
    [12]胡国明.颗粒系统的离散元素法分析仿真[M].武汉:武汉理工大学出版社,2010.
    [13]JOHNSON K L,ROBERTS A D.Surface energy and the contact of elastic solid s[J].Royal Society of London Proceedings,1971,324(1558):301-313.
    [14]刘凯,朱天容,刘庭,等.绝缘子污秽成分分析与清洗剂去污机理研究[J].高电压技术,2012,38(4):892-898.
    [15]王黎明,刘霆,梅红伟,等.基于计算流体力学的支柱绝缘子积污特性研究[J].高电压技术,2015,41(8):2741-2749.