阶跃信号电探针诊断爆轰加载下金属微喷现象
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摘要
针对目前缺乏用于狭小测试空间复杂结构金属样品的微喷现象诊断技术的现状,探索使用阶跃信号电探针诊断爆轰加载下金属样品微喷现象的方法。设计阶跃信号电探针测试技术,开展仿真验证电探针在微喷物质导通下K+R_X模式的放电机理。在爆轰微喷实验中通过电探针信号观察到准连续状态微喷区及其存在的两种动作演化过程:阶梯放电曲线表征微喷物质随靠近后界面密度逐步增加,多次放电现象表征微喷物质从连续状态拉升变为离散状态。采用微射流模型描述准连续状态微喷区物质状态,通过电平曲线计算出被测物质等效电阻,再通过等效电阻计算微射流的等效尺寸,从而可描述准连续状态微喷区物质的密度。
There is a lack in technology that is suitable for characterizing the shock-induced micro-jetting of metal sample with complex configuration. In this work, step signal electric probe is developed to characterize micro-jetting. The probe is designed by numerical simulation and the discharging mechanism(K+R_X model)of probe caused by micro-jetting is also verified by simulation. Quasi-continuous micro-jetting region can be directly observed on the probed signal and two kinds of dynamic processes exist: density increasing and pulling-extending to discrete state. The mass in quasi-continuous micro-jetting region is described by microjetting model, the equivalent size of micro-jetting is calculated based on the equivalent resistance that is obtained from the voltage signal. Thus the density of the quasi-continuous micro-jetting is obtained.
There is a lack in technology that is suitable for characterizing the shock-induced micro-jetting of metal sample with complex configuration. In this work, step signal electric probe is developed to characterize micro-jetting. The probe is designed by numerical simulation and the discharging mechanism(K+R_X model)of probe caused by micro-jetting is also verified by simulation. Quasi-continuous micro-jetting region can be directly observed on the probed signal and two kinds of dynamic processes exist: density increasing and pulling-extending to discrete state. The mass in quasi-continuous micro-jetting region is described by microjetting model, the equivalent size of micro-jetting is calculated based on the equivalent resistance that is obtained from the voltage signal. Thus the density of the quasi-continuous micro-jetting is obtained.
引文
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[2]MONFAREED S K,ORO D M,GROVER M,et al.Experimental observation on the links between surface perturbation parameter and shock-induced mass ejection[J].Journal of Applied Physics,2016,116:0636504.
[3]ASAY J R.Material ejection from shock-loaded free surfaces of aluminums and lead:SAND-76-0542[R].1976.
[4]VOGAN W S,ANDERSON W W,GROVER M,et al.Piezoelectric characterization of jetting from shocked tin surfaces[J].Journal of Applied Physics,2005,98:113508.
[5]SIGNOR L,DRAGON A,et al.Investigation of fragments size resulting from dynamic fragmentation in melted state of laser shock-loaded tin[J].International Journal of Impact Engineering,2010,37:887-900.
[6]BUTTLER W T,ORO D M,OLSON R T,et al.Second shock jetting measurement with an explosive driven two-shockwave drive[J].Journal of Applied Physics,2014,116:103519.
[7]MCMILLAN C,WHISPKY R.Holographic measurement of jetting from shocked metal surface[J].SPIE High Speed Photography and Photonics,1988,1032:553-557.
[8]汪伟,李作友,李欣竹,等.用超高速阴影摄影技术研究微喷现象[J].应用光学,2008,29(4):526-529.WANG Wei,LI Zuoyou,LI Xinzhu,et al.Study on micro-jet on ultra-high speed shadow photography[J].Journal of Applied Optics,2008,29(4):526-529.
[9]ZELLER M B,MCNEIL W V,GRAY G T,et al.Surface preparation methods to enhance dynamic surface property measurements of shocked metal surfaces[J].Journal of Applied Physics,2008,103:083521.
[10]黄正平.爆炸与冲击电测技术[M].北京:国防工业出版社.2006:617-623.
[11]王翔,贾路峰,傅秋卫,等.宽脉冲网络信号源及应用[J].高压物理学报,2005,19(3):279-283.WANG Xiang,JIA Lufeng,FU Qiuwei,et al.Broad pulse forming circuit and its appl ication[J].Chinese Journal of High Pressure Physics,2005,19(3):279-283.
[12]文雪峰,王晓燕,王健,等.可识别微层裂前界面的阶跃信号电探针测试技术[J].爆炸与冲击,2018,38(2):309-315.DOI:10.11883/bcycj-2016-0271.WEN Xuefeng,WANG Xiaoyan,WANG Jian,et al.A step-signal electric probe technology for recognasing the front surface of micro-spall[J].Explosion and Shock Waves,2018,38(2):309-315.DOI:10.11883/bcycj-2016-0271.
[13]SEIFTER A,FURLANETTO M R,GROVER M,et al.Use of IR pyrometry to measure free-surface temperature of partially melted tin as a function of shock pressure[J].Journal of Applied Physics,2009,105:123526.