高频感应加热全数字锁相环的分析与FPGA实现
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  • 英文篇名:Analysis and Implementation of All-digital Phase-locked Loop in High-frequency Induction Heating Based on FPGA
  • 作者:马莽原 ; 石新春 ; 付超 ; 王慧 ; 孟建辉
  • 英文作者:MA Mangyuan;SHI Xinchun;FU Chao;WANG Hui;MENG Jianhui;State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources,North China Electric Power University;
  • 关键词:高频感应加热 ; 全数字锁相环 ; 现场可编程门列阵逻辑器件 ; Z域分析
  • 英文关键词:high-frequency induction heating;;all digital phase-locked loop(ADPLL);;field programmable gate array(FPGA)logical device;;Z domain analysis
  • 中文刊名:DQCZ
  • 英文刊名:Electric Drive
  • 机构:华北电力大学新能源电力系统国家重点实验室;
  • 出版日期:2018-10-31 09:50
  • 出版单位:电气传动
  • 年:2019
  • 期:v.49;No.351
  • 语种:中文;
  • 页:DQCZ201901008
  • 页数:4
  • CN:01
  • ISSN:12-1067/TP
  • 分类号:41-43+54
摘要
全数字锁相环存在非线性部件,传递函数难以表达。通过Z域分析法选择合适的参数,分析了触发器型全数字锁相环的工作原理,得出Z域闭环传递函数,并以此研究了锁相环的全局稳定性和稳态误差,提出了各参数的约束条件。采用Xilinx ISim仿真与FPGA逻辑器件验证相结合的方法实现了一种单相全数字锁相环,并给出实验结果。结果表明,该锁相环具有锁相范围宽、动态响应快和稳态误差小的特点,具有一定的应用价值。
        The transfer function of all digital phase-locked loop is difficult to obtain because of the non-linear parts. The operation principle of flip-flop all digital phase-locked loop was analyzed and the Z domain closed loop transfer function was obtained by the method of Z domain analysis with proper parameters. The global stability and the steady-state error of the phase-locked loop were studied and the parameter constraints relationship was built. A kind of all digital phase-locked loop was designed by using Xilinx ISim simulation and FPGA logical device,and the experiment results were given. The results show that this all digital phase-locked loop has a wide frequency range,fast dynamic response,small steady-state error and certain application value.
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