Surrogating circuit design solutions with robustness metrics
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- 作者：Jin Suna ; b ; sunj@njust.edu.cn" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; Liang Xiaoa ; xiaoliang@njust.edu.cn" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; Jiangshan Tiana ; 912106840410@njust.edu.cn" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; He Zhoub ; hezhou@email.arizona.edu" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; Janet Rovedab ; meilingw@email.arizona.edu" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae
- 关键词：Robust design ; Robustness metric ; ElasticR method ; Surrogates ; Process variations
- 刊名：Integration, the VLSI Journal
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：52
- 期：Complete
- 页码：1-9
- 全文大小：800 K
文摘
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A new robustness model that estimates robustness of both design variability and performance uncertainty.
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A two-way mapping design framework that integrates design space robustness and performance space robustness.
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A surrogate-based optimization procedure for the proposed design methodology.
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Promising robustness improvements compared with the conventional robust design approach.