We report on the multiple ZnO nanowires field-effect transistors (FETs), which were formed by assemblingas-synthesized ZnO nanowires on a SiO
2/Si substrate using an optimized alternating current (AC)dielectrophoresis (DEP) technique in three-probe back-gate geometry. The AC DEP was optimized with abias voltage of 10 V
p-p at a frequency of 10 kHz. Our multiple ZnO nanowires FETs containing ca. 50~65nanowires in one device exhibited excellent electrical characteristics with a transconductance of 3~11.5
Sat a drain voltage of 1~5 V, a mobility of ~30 cm
2/V·s, and a carrier concentration of 9.4 × 10
17 cm
-3. Fora comparison study, we also present conventional single ZnO nanowire FETs prepared by e-beam lithographywith a back-gate structure.