用户名: 密码: 验证码:
Large and Uniform Optical Emission Shifts in Quantum Dots Strained along Their Growth Axis
详细信息    查看全文
文摘
We introduce a calibration method to quantify the impact of external mechanical stress on the emission wavelength of distinct quantum dots (QDs). Specifically, these emitters are integrated in a cross-section of a semiconductor core wire and experience a longitudinal strain that is induced by an amorphous capping shell. Detailed numerical simulations show that, thanks to the shell mechanical isotropy, the strain in the core is uniform, which enables a direct comparison of the QD responses. Moreover, the core strain is determined in situ by an optical measurement, yielding reliable values for the QD emission tuning slope. This calibration technique is applied to self-assembled InAs QDs submitted to incremental elongation along their growth axis. In contrast to recent studies conducted on similar QDs submitted to a uniaxial stress perpendicular to the growth direction, optical spectroscopy reveals up to ten times larger tuning slopes, with a moderate dispersion. These results highlight the importance of the stress direction to optimize the QD optical shift, with general implications, both in static and dynamic regimes. As such, they are in particular relevant for the development of wavelength-tunable single-photon sources or hybrid QD opto-mechanical systems.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700