Electron Interference in Hall Effect Measurements on GaAs/InAs Core/Shell Nanowires
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- 作者：Fabian HaasPatrick Zellekens ; Mihail Lepsa ; Torsten Rieger ; Detlev Grützmacher ; Hans Lüth ; Thomas Schäpers
- 刊名：Nano Letters
- 出版年：2017
- 出版时间：January 11, 2017
- 年：2017
- 卷：17
- 期：1
- 页码：128-135
- 全文大小：525K
- ISSN：1530-6992
文摘
We present low-temperature magnetotransport measurements on GaAs/InAs core/shell nanowires contacted by regular source–drain leads as well as laterally attached Hall contacts, which only touch parts of the nanowire sidewalls. Low-temperature measurements between source and drain contacts show typical phase coherent effects, such as universal conductance fluctuations in a magnetic field aligned perpendicularly to the nanowire axis as well as Aharonov–Bohm-type oscillations in a parallel aligned magnetic field. However, the signal between the Hall contacts shows a Hall voltage buildup, when the magnetic field is turned perpendicular to the nanowire axis while current is driven through the wire using the source–drain contacts. At low temperatures, the phase coherent effects measured between source and drain leads are superimposed on the Hall voltage, which can be explained by nonlocal probing of large segments of the nanowire. In addition, the Aharonov–Bohm-type oscillations are also observed in the magnetoconductance at magnetic fields aligned parallel to the nanowire axis, using the laterally contacted leads. This measurement geometry hereby directly corresponds to classical Aharonov–Bohm experiments using planar quantum rings. In addition, the Hall voltage is used to characterize the nanowires in terms of charge carrier concentration and mobility, using temperature- and gate-dependent measurements as well as measurements in tilted magnetic fields. The GaAs/InAs core/shell nanowire used in combination with laterally attached contacts is therefore the ideal system to three-dimensionally combine quantum ring experiments using the cross-sectional plane and Hall experiments using the axial nanowire plane.