Analysis of Nickel Defect in Diamond with Photoluminescence upon Excitation near 200 nm

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• 作者：Hsiao-Chi Lu ; Yu-Chain Peng ; Meng-Yeh Lin ; Sheng-Lung Chou ; Jen-Iu Lo ; Bing-Ming Cheng
• 刊名：Analytical Chemistry
• 出版年：2015
• 出版时间：July 21, 2015
• 年：2015
• 卷：87
• 期：14
• 页码：7340-7344
• 全文大小：281K
• ISSN：1520-6882

文摘

Photoluminescent (PL) spectra of synthetic diamond powders at temperatures between 10 and 300 K were excited with synchrotron radiation in the wavelength range 125鈥?75 nm. Prominent spectral PL features were detected at 484.6 and 489.0 nm (2.559 and 2.535 eV), associated with nickel defect. During our measurement of PL excitation (PLE) spectra of Ni defect in diamond, we observed a distinct PLE line at 215 nm for the first time. We thereby suggest the use of UV-PL spectra excited in the region 200鈥?20 nm to analyze and to identify nickel defect in diamonds.