用户名: 密码: 验证码:
Limitations of H-κ stacking: ambiguous results caused by crustal layering
详细信息    查看全文
文摘
Over the past decade, the H-κ stacking technique of Zhu and Kanamori (J Geophys Res 105:2969–2980, 2000) has become a standard tool to determine the crustal thickness H and the bulk crustal vP/vS ratio κ from teleseismic receiver functions. It is obvious that unfavorable noise conditions as well as a complex 3D velocity structure can severely hamper the interpretation of receiver-function data. However, we observe that ambiguities can even arise from a simple 1D layered velocity structure which raises a high potential for misinterpretations. To analyze the feasibility and basic limitations of the H-κ stacking method, we conduct a series of tests based on synthetic data. The impact of different given elementary parameters, related either to the velocity structure or to the data processing, is evaluated in a series of eight individual tests. We deliberately exclude complications such as 3D structural variations and/or noise to show that even a simple 1D velocity structure, involving, e.g., an additional inter-crustal discontinuity, can have significant consequences for the interpretation of the results. However, our modeling suggests that more complex crustal structures may lead to even less reliable results. Additionally, our tests illustrate that time shifts of the maxima in the H-κ domain due to the superposition and merging of individual phases can lead to significantly overestimated vP/vS ratios. In general, the depth to the Moho (or other discontinuities of interest) is less significantly affected. Our tests indicate the necessity to accurately check delay times derived from the maxima of the H-κ stacks against corresponding phases in the receiver functions. Repeating the stacking with varied weighting factors and filter ranges can help to reduce the ambiguities and to avoid possible misinterpretation.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700