Evolution of the properties of ZnO thin films subjected to heating treatments

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• 作者：Petronela Prepelita¹ ; N. Stefan ; C. Luculescu ; F. Garoi ; ^{florin.garoi@gmail.com} ; R. Birjega
• 关键词：Thin films ; Zinc oxide ; Magnetron sputtering ; Heating treatments ; Structural properties ; Transparent films
• 刊名：Thin Solid Films
• 出版年：2012
• 期刊代码：78_00406090
• 类别：ph
• 出版时间：1 May, 2012
• 卷：520
• 期：14
• 页码：4689-4693
• 文件大小：1100 K

摘要

Structural and optical properties of ZnO thin films (200 nm thickness) deposited using magnetron sputtering technique are influenced by structural defects. Therefore, we applied various heating treatments in order to control and improve the crystallinity of the samples. These treatments were realized in air at temperatures of 350 掳C, 550 掳C and 700 掳C respectively, each for a duration of 1 h. The properties of the samples were investigated both before and after the heating treatment. Modern methods like X-ray Diffraction, Atomic Force Microscopy and Scanning Electron Microscopy were used to analyze the structure and morphology of the heated ZnO thin films. These heating treatments may be held responsible for rearrangements in the morphology of the thin films. Thus, it was observed that an increase of porosity and agglomeration of the crystallites is followed by an increase in the size of the crystallites. Inter-crystalline borders will migrate determining a coalescence of several crystallites during the heating process, as well. As a consequence, an increase of the band gap width from 3.26 eV to 3.30 eV (at 350 掳C) and 3.32 eV (at 550 掳C) respectively, occurred.