Sibur chooses PP technology

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• 关键词：Lithics ; Use-wear ; Lithic Microwear ; LSCM ; Confocal microscopy ; SEM ; Quantification
• 刊名：Pump Industry Analyst
• 出版年：2008
• 期刊代码：149_13596128
• 类别：et
• 出版时间：May 2008
• 卷：2008
• 期：5
• 页码：3
• 文件大小：50 K

摘要

The key problem restricting lithic microwear analysis is the lack of quantitative analysis to support qualitative assessments of different wear traces. This paper presents the reflective laser scanning confocal microscope (LSCM) as a new technique for the study of lithic microwear that has the potential to resolve this problem. Firstly, an example is presented that shows how the LSCM compares with conventional reflected light microscopy and scanning electron microscopy. This shows that images, rivalling that of the SEM, can be produced in similar timescales to conventional photomicrography and with no need for casting or sample preparation. The LSCM is also used to measure surface roughness of use-wear produced from working hide (dry, fresh and greasy), woodworking and antler working. This analysis demonstrates clear differences between the different wear polishes and the potential of the LSCM as a quantitative approach in lithic microwear research.