Refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers

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• 作者：Wei Wei ; Xia Zhang ; ^{xzhang@bupt.edu.cn} ; Xin Guo ; Long Zheng ; Jing Gao ; Weipeng Shi ; Qi Wang ; Yongqing Huang ; Xiaomin Ren
• 关键词：Surface plasmon resonance ; Microstructured optical fiber ; Sensors ; Ag nanolayer
• 刊名：Optik - International Journal for Light and Electron Optics
• 出版年：2012
• 期刊代码：13_00304026
• 类别：et
• 出版时间：July, 2012
• 卷：123
• 期：13
• 页码：1167-1170
• 文件大小：741 K

摘要

We propose refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers. The surface plasmon resonance modes and the sensing properties are theoretically analyzed using finite element method (FEM). In the calculation, Drude-Lorentz model is used to describe the Metal Dielectric constant. The calculation results show that the sensitivity of Ag-metalized SPR sensor can reach 1500 nm/RIU corresponding to a resolution of 6.67 脳 10^鈭? RIU. Comparing with conventional detecting material-Au under the same structure, the sensitivity and 3 dB bandwidth of our device are better.