On the oxidation of CaF₂ in transmission electron microscope

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• 作者：Nan Jiang ^{nan.jiang@asu.edu}
• 关键词：Oxidation ; EELS ; CaF2
• 刊名：Micron
• 出版年：2012
• 期刊代码：37_09684328
• 类别：ph
• 出版时间：June, 2012
• 卷：43
• 期：6
• 页码：746-754
• 文件大小：1354 K

摘要

Electron stimulated oxidation of CaF₂ in transmission electron microscope has been thoroughly studied using various electron microscopy techniques, including imaging, electron diffraction and electron energy-loss spectroscopy. It found that the electron irradiation induced CaO locate on the edge of specimen. The oxidation process is associated with desorption of F by electron irradiation, and originates from O impurities in the specimen. Driven by electric field produced by electron irradiation, the O ions inside bulk diffuse to the edge region, occupying the interstitials of metallized Ca lattice. Therefore, the accumulation of O along the edge of specimen results in forming CaO.