基于过程免疫时间的半导体企业电压暂降经济损失预评估方法
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摘要
电压暂降已成为最严重的电能质量问题,给用户带来了极大的经济损失。国内外目前针对半导体企业电压暂降经济损失预评估的研究较少,为此本文提出一种基于过程免疫时间的实用评估方法。首先,以液晶屏面板为研究对象,应用故障树分析法对半导体复杂的生产过程进行分解以确定关键设备的逻辑连接关系;其次,结合实测的设备过程免疫时间和逻辑连接关系推算生产过程的综合过程免疫时间;再次,依据历史电压暂降监测数据和综合过程免疫时间预测生产过程中断次数;最后,结合生产过程中断次数和单次中断经济损失预估用户总经济损失值。实例分析结果验证了所提方法符合工程实际,具备可行性,对新投建的半导体生产线选择电压暂降治理方案、制定生产计划具有参考意义。
Voltage sags have become the most serious power quality problems,which bring great economic losses to power users. In view of the lack of research on predicting economic losses due to voltage sags in semiconductor industry at home and abroad so far,a practical pre-evaluation method based on process immunity iime( PIT) is proposed. Firstly,to determine the logical connection between key devices,the production process of semiconductor has been decomposed in the method of fault tree by the example of TFT-LCD. Secondly,the PITs of the key devices have been obtained by the measured data,and the comprehensive PITs of production process are deducted by the logical connection between key devices and the PITs of key device. Then,according to historical data of voltage sags and comprehensive PIT curve,the number of production process trips can be predicted. Finally,according to the number of production process trips and economic losses for single process trip,the whole economic losses value can be calculated. The results of case analysis verify the correctness and feasibility of the method. This method has important guidance and reference value for semiconductor enterprise in selecting voltage sag treatment scheme and formulating production plan,which conforms to engineering practice.
Voltage sags have become the most serious power quality problems,which bring great economic losses to power users. In view of the lack of research on predicting economic losses due to voltage sags in semiconductor industry at home and abroad so far,a practical pre-evaluation method based on process immunity iime( PIT) is proposed. Firstly,to determine the logical connection between key devices,the production process of semiconductor has been decomposed in the method of fault tree by the example of TFT-LCD. Secondly,the PITs of the key devices have been obtained by the measured data,and the comprehensive PITs of production process are deducted by the logical connection between key devices and the PITs of key device. Then,according to historical data of voltage sags and comprehensive PIT curve,the number of production process trips can be predicted. Finally,according to the number of production process trips and economic losses for single process trip,the whole economic losses value can be calculated. The results of case analysis verify the correctness and feasibility of the method. This method has important guidance and reference value for semiconductor enterprise in selecting voltage sag treatment scheme and formulating production plan,which conforms to engineering practice.
引文
[1]章雪萌(Zhang Xuemeng).电压暂降源的定位与暂降经济性研究(Study on the source location and economy of voltage sag)[D].北京:华北电力大学(Beijing:North China Electric Power University),2010.
[2]刘旭娜,肖先勇,汪颖(Liu Xuna,Xiao Xianyong,Wang Ying).电压暂降严重程度及其测度、不确定性评估方法(Voltage sag severity and its measure and uncertainty evaluation)[J].中国电机工程学报(Proceedings of the CSEE),2014,34(4):644-658.
[3]刘勃江,李华强,肖先勇,等(Liu Bojiang,Li Huaqiang,Xiao Xianyong,et al.).敏感设备电压暂降故障水平的风险评估(Risk assessment for failure level of sensitive equipment caused by voltage sag)[J].电力系统及其自动化学报(Proceedings of the CSU-EPSA),2016,28(3):87-92.
[4]唐琳,肖先勇,张逸,等(Tang Lin,Xiao Xianyong,Zhang Yi,et al.).电压暂降状态和水平评估模式匹配法与监测装置多目标优化配置(Voltage sag state and level assessment based on pattern matching method and multi-objective optimal monitors allocation)[J].中国电机工程学报(Proceedings of the CSEE),2015,35(13):3264-3271.
[5]周林,吴红春,孟婧,等(Zhou Lin,Wu Hongchun,Meng Jing,et al.).电压暂降分析方法研究(Study of the voltage sag analysis methods)[J].高电压技术(High Voltage Engineering),2008,34(5):1010-1016.
[6]Targosz R,Manson J.Pan-European LPQI power quality survey[A].9th International Conference on Electrical Power Quality and Utilisation[C].2007.1-6.
[7]Milanovic J V,Gupta C P.Probabilistic assessment of financial losses due to interruptions and voltage sags-Part I:The methodology[J].IEEE Transactions on Power Delivery,2006,21(2):918-924.
[8]Milanovic J V,Gupta C P.Probabilistic assessment of financial losses due to interruptions and voltage sags-Part II:Practical implementation[J].IEEE Transactions on Power Delivery,2006,21(2):925-932.
[9]丁泽俊,陈波,雷金勇,等(Ding Zejun,Chen Bo,Lei Jinyong,et al.).电压暂降的经济损失评估(Economic loss assessment of voltage sag)[J].现代电力(Modern Electric Power),2011,28(5):90-94.
[10]GB/Z 32880.1-2016,电能质量经济性评估-第1部分:电力用户的经济性评估方法(Ecomomic evaluation of power quality-Part 1:Economic evaluation method for the end-users)[S].
[11]刘阳,肖先勇,刘旭娜,等(Liu Yang,Xiao Xianyong,Liu Xuna,et al.).考虑用户定量需求的优质电力园区DVR优化配置(Optimal configuration of DVR in premium power park considering customers’quantitative demand)[J].电网技术(Power System Technology),2015,39(3):823-828.
[12]CIGRE/CIRED/UIE Joint Working Group C4.110.Voltage dip immunity of equipment and installations[R].Paris,France:CIGRE,2010.
[13]李春海,李华强,刘勃江(Li Chunhai,Li Huaqiang,Liu Bojiang).基于过程免疫不确定性的工业用户电压暂降经济损失风险评估(Risk assessment based on process immunity uncertainty for industrial customers’financial losses due to voltage sags)[J].电力自动化设备(Electric Power Automation Equipment),2016,36(12):136-142.
[14]陈程(Chen Cheng).液晶屏成盒后电测与亮点检出机理研究(Research on voltage test and highlight after cell process of TFT-LCD)[D].上海:复旦大学(Shanghai:Fudan University),2011.
[15]Yasir M,Kazemi S,Lehtonen M,et al.A novel approach for assessing the impacts of voltage sag events on customer operations[A].IEEE Electric Power Quality and Supply Reliability Conference[C].2012.1-5.
[2]刘旭娜,肖先勇,汪颖(Liu Xuna,Xiao Xianyong,Wang Ying).电压暂降严重程度及其测度、不确定性评估方法(Voltage sag severity and its measure and uncertainty evaluation)[J].中国电机工程学报(Proceedings of the CSEE),2014,34(4):644-658.
[3]刘勃江,李华强,肖先勇,等(Liu Bojiang,Li Huaqiang,Xiao Xianyong,et al.).敏感设备电压暂降故障水平的风险评估(Risk assessment for failure level of sensitive equipment caused by voltage sag)[J].电力系统及其自动化学报(Proceedings of the CSU-EPSA),2016,28(3):87-92.
[4]唐琳,肖先勇,张逸,等(Tang Lin,Xiao Xianyong,Zhang Yi,et al.).电压暂降状态和水平评估模式匹配法与监测装置多目标优化配置(Voltage sag state and level assessment based on pattern matching method and multi-objective optimal monitors allocation)[J].中国电机工程学报(Proceedings of the CSEE),2015,35(13):3264-3271.
[5]周林,吴红春,孟婧,等(Zhou Lin,Wu Hongchun,Meng Jing,et al.).电压暂降分析方法研究(Study of the voltage sag analysis methods)[J].高电压技术(High Voltage Engineering),2008,34(5):1010-1016.
[6]Targosz R,Manson J.Pan-European LPQI power quality survey[A].9th International Conference on Electrical Power Quality and Utilisation[C].2007.1-6.
[7]Milanovic J V,Gupta C P.Probabilistic assessment of financial losses due to interruptions and voltage sags-Part I:The methodology[J].IEEE Transactions on Power Delivery,2006,21(2):918-924.
[8]Milanovic J V,Gupta C P.Probabilistic assessment of financial losses due to interruptions and voltage sags-Part II:Practical implementation[J].IEEE Transactions on Power Delivery,2006,21(2):925-932.
[9]丁泽俊,陈波,雷金勇,等(Ding Zejun,Chen Bo,Lei Jinyong,et al.).电压暂降的经济损失评估(Economic loss assessment of voltage sag)[J].现代电力(Modern Electric Power),2011,28(5):90-94.
[10]GB/Z 32880.1-2016,电能质量经济性评估-第1部分:电力用户的经济性评估方法(Ecomomic evaluation of power quality-Part 1:Economic evaluation method for the end-users)[S].
[11]刘阳,肖先勇,刘旭娜,等(Liu Yang,Xiao Xianyong,Liu Xuna,et al.).考虑用户定量需求的优质电力园区DVR优化配置(Optimal configuration of DVR in premium power park considering customers’quantitative demand)[J].电网技术(Power System Technology),2015,39(3):823-828.
[12]CIGRE/CIRED/UIE Joint Working Group C4.110.Voltage dip immunity of equipment and installations[R].Paris,France:CIGRE,2010.
[13]李春海,李华强,刘勃江(Li Chunhai,Li Huaqiang,Liu Bojiang).基于过程免疫不确定性的工业用户电压暂降经济损失风险评估(Risk assessment based on process immunity uncertainty for industrial customers’financial losses due to voltage sags)[J].电力自动化设备(Electric Power Automation Equipment),2016,36(12):136-142.
[14]陈程(Chen Cheng).液晶屏成盒后电测与亮点检出机理研究(Research on voltage test and highlight after cell process of TFT-LCD)[D].上海:复旦大学(Shanghai:Fudan University),2011.
[15]Yasir M,Kazemi S,Lehtonen M,et al.A novel approach for assessing the impacts of voltage sag events on customer operations[A].IEEE Electric Power Quality and Supply Reliability Conference[C].2012.1-5.