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Influence of Debye Plasma on the KLL Dielectronic Recombination of H-Like Helium Ions
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  • 英文篇名:Influence of Debye Plasma on the KLL Dielectronic Recombination of H-Like Helium Ions
  • 作者:张登红 ; 颉录有 ; 蒋军 ; 董晨钟
  • 英文作者:Deng-Hong Zhang;Lu-You Xie;Jun Jiang;Chen-Zhong Dong;Key Laboratory of Atomic and Molecular Physics and Functional Materials of Gansu Province,College of Physics and Electronic Engineering, Northwest Normal University;
  • 中文刊名:WLKB
  • 英文刊名:中国物理快报(英文版)
  • 机构:Key Laboratory of Atomic and Molecular Physics and Functional Materials of Gansu Province,College of Physics and Electronic Engineering, Northwest Normal University;
  • 出版日期:2019-08-09
  • 出版单位:Chinese Physics Letters
  • 年:2019
  • 期:v.36
  • 基金:Supported by the National Key Research and Development Program of China under Grant No 2017YFA0402300;; the National Natural Science Foundation of China under Grant Nos 11864036,11564036 and 11774292
  • 语种:英文;
  • 页:WLKB201908007
  • 页数:4
  • CN:08
  • ISSN:11-1959/O4
  • 分类号:39-42
摘要
Using the Debye shielding model, the effects of plasma shielding on the dielectronic recombination processes of the H-like helium ions are investigated.It is found that plasma shielding causes a remarkable change in the Auger decay rate of the doubly excited 2p~2 ~3P_2 state.As a result,the dielectronic recombination cross sections from the doubly excited 2p~2 ~3p_2 state increases with the decreasing Debye shielding length.
        Using the Debye shielding model, the effects of plasma shielding on the dielectronic recombination processes of the H-like helium ions are investigated.It is found that plasma shielding causes a remarkable change in the Auger decay rate of the doubly excited 2p~2 ~3P_2 state.As a result,the dielectronic recombination cross sections from the doubly excited 2p~2 ~3p_2 state increases with the decreasing Debye shielding length.
引文
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