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基于错位散斑干涉的复合绝缘子缺陷检测方法
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  • 英文篇名:Defects Detection Methods for Composite Insulators Based on Shearing Speckle Interferometry
  • 作者:刘立帅 ; 王黎明 ; 梅红伟 ; 郭晨鋆
  • 英文作者:LIU Lishuai;WANG Liming;MEI Hongwei;GUO Chenjun;Graduate School at Shenzhen, Tsinghua University;Electric Power Research Institute of Yunnan Power Grid Co., Ltd.;
  • 关键词:复合绝缘子 ; 错位散斑干涉 ; 内部缺陷 ; 无损检测 ; 表面形变
  • 英文关键词:composite insulator;;shearing speckle interferometry;;internal defects;;nondestructive testing;;surface deformation
  • 中文刊名:ZGDC
  • 英文刊名:Proceedings of the CSEE
  • 机构:清华大学深圳研究生院;云南电网有限责任公司电力科学研究院;
  • 出版日期:2018-11-30 13:48
  • 出版单位:中国电机工程学报
  • 年:2019
  • 期:v.39;No.626
  • 基金:国家重点研发计划项目(2017YFB0902702);; 深圳市基础研究项目(JCYJ20170817160926795)~~
  • 语种:中文;
  • 页:ZGDC201915027
  • 页数:8
  • CN:15
  • ISSN:11-2107/TM
  • 分类号:283-290
摘要
提出一种基于错位散斑干涉的复合绝缘子内部缺陷检测方法,用于剔除生产中的不合格绝缘子以及诊断运行中复合绝缘子的隐蔽缺陷。该方法通过测量内部缺陷引起的表面异常形变来诊断复合绝缘子的缺陷及其严重程度,相比其他无损检测技术具有速度快、精度高、非接触、全场成像等特点。检测在芯棒、护套以及交界面区域设置了人工缺陷的绝缘子样品,通过得到的干涉条纹图和相位分布图快速、直观地检测到了缺陷信息。通过人工缺陷检测试验证实了错位散斑干涉方法应用于复合绝缘子内部缺陷检测的可行性。
        In order to eliminate defective insulators during production and support for fault diagnosis of onsite insulators,a detection method for composite insulators based on shearing speckle interferometry was presented. This method determines the defect and how much it weaken the composite insulator by measuring the surface deformation anomaly induced by the defect. Comparing with other nondestructive testing methods,the shearing speckle interferometry method has the advantages of quick testing, high accuracy, noncontact measurement and full-field imaging. The samples with artificial defects in the core, sheath and interface were detected to yield fringe patterns and phase maps, and the defects can be thus identified quickly and intuitively. The feasibility of shearing speckle interferometry method for detecting defects in composite insulators was verified by experiments.
引文
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