窄脉冲阵列激光器峰值功率测试的研究
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摘要
窄脉冲半导体激光器阵列输出的峰值功率必须准确测量,测量精度直接关系到光电系统的质量。本文介绍一种基于对数放大技术和8051F020单片机,采用脉冲展宽和峰值保持原理,通过快速放电复零从而直接测量窄脉冲阵列半导体激光器峰值功率的方法。测试结果表明,标定误差小于3%,测量准确度高,重复测量误差都在±1.7%之内。该测量方法研制的仪器具备便携、测试速度快、成本低的特点,并具有波形输出接口,适合空间有限的快速检测需求。
The peak power of narrow pulsed semiconductor laser arrays should be measured accurately,and the measurement accuracy is directly related to the quality of photoelectric system.In this paper,a measurement technique for measuring the peak power of narrow pulsed semiconductor laser arrays is proposed.The technique collect the data by logarithmic amplification technology and 8051F020 single chip microcomputer.The peak power is measured directly by broadening pulse width,holding peak and resetting with discharging rapidly.The test results show that the calibration error is less than 3%,the measurement accuracy is high,and the repeated measurement error is within 1.7%.The instrument developed by this method has the characteristics of portability,fast test speed and low cost,and has waveform output interface,which is suitable for the rapid test with limited space.
The peak power of narrow pulsed semiconductor laser arrays should be measured accurately,and the measurement accuracy is directly related to the quality of photoelectric system.In this paper,a measurement technique for measuring the peak power of narrow pulsed semiconductor laser arrays is proposed.The technique collect the data by logarithmic amplification technology and 8051F020 single chip microcomputer.The peak power is measured directly by broadening pulse width,holding peak and resetting with discharging rapidly.The test results show that the calibration error is less than 3%,the measurement accuracy is high,and the repeated measurement error is within 1.7%.The instrument developed by this method has the characteristics of portability,fast test speed and low cost,and has waveform output interface,which is suitable for the rapid test with limited space.
引文
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[6] WANG Chengyang,CHEN Zhibin,ZHUO Jiajing,et al.Comprehensive test technology of pulsed laser peak power in common wavebands[J].Journal of Applied Optics,2007,28(1):72-76.(in Chinese)王呈阳,陈志斌,卓家靖,等.几种常见波段脉冲激光峰值功率综合测试技术研究[J].应用光学,2007,28(1):72-76.
[7] Mpghimi R.Log-ratio amplifier has six-decade dynamic range[J].EDN,2003,48(26):90.
[8] Buckens P F,Veatch M S.A high performance peak dectet & hold circuit for pulse height analysis[J].IEEE Trans Nucl Sci,1992,NS 39(4):753-757.
[9] CHEN Dejin,Liang C,Zhao J.Data acquisition and analysis system based on 8051F020[J].China Measurement & Test,2009,35(2):57-60.(in Chinese)陈德金,程亮,赵军.基于8051F020的数据采集分析系统[J].中国测试,2009,35(2):57-60.
[10] JU Xiaodong.Operational accuracy representation of logarithmic amplifier[J].Electronic Technology,1985,(5):45.(in Chinese)鞠晓东.对数放大器运算精度表示法[J].电子技术,1985,(5):45.
[2] HAN Gang,YAN Bo.Study on testing method for peak power and average power of pulse laser[J].Industrial Measurement,2008,18(6):4-6.(in Chinese)韩刚,闫博.脉冲激光峰值/平均功率测试方法研究[J].工业计量,2008,18(6):4-6.
[3] ZHANG Guijun,ZHANG Rui,FENG Kaifei.Study on the methods of measurement and calibration of the peak power of the narrow pulsed semiconductor laser[J].Laser Journal,2009,30(1):26-27.(in Chinese)张贵军,张锐,冯凯飞.窄脉冲半导体激光器峰值功率测试及校准方法研究[J].激光杂志,2009,30(1):26-27.
[4] XIONG Yan,LU Yaodong,ZHU Min,et al.Design of peak holding circuit for narrow laser pulse[J].Laser & Infrared,2012,42(12):1377-1380.(in Chinese)熊焱,陆耀东,祝敏,等.窄脉冲激光信号峰值保持电路设计[J].激光与红外,2012,42(12):1377-1380.
[5] ZHU Min,LU Yaodong,MAN Chunyang,et al.Peak power measurement of high power and high speed diode laser[J].Journal of Optoelectronics Laser,2006,17(11):1343-1345.(in Chinese)祝敏,陆耀东,满春阳,等.大功率高速半导体激光峰值功率测试技术研究[J].光电子·激光,2006,17(11):1343-1345.
[6] WANG Chengyang,CHEN Zhibin,ZHUO Jiajing,et al.Comprehensive test technology of pulsed laser peak power in common wavebands[J].Journal of Applied Optics,2007,28(1):72-76.(in Chinese)王呈阳,陈志斌,卓家靖,等.几种常见波段脉冲激光峰值功率综合测试技术研究[J].应用光学,2007,28(1):72-76.
[7] Mpghimi R.Log-ratio amplifier has six-decade dynamic range[J].EDN,2003,48(26):90.
[8] Buckens P F,Veatch M S.A high performance peak dectet & hold circuit for pulse height analysis[J].IEEE Trans Nucl Sci,1992,NS 39(4):753-757.
[9] CHEN Dejin,Liang C,Zhao J.Data acquisition and analysis system based on 8051F020[J].China Measurement & Test,2009,35(2):57-60.(in Chinese)陈德金,程亮,赵军.基于8051F020的数据采集分析系统[J].中国测试,2009,35(2):57-60.
[10] JU Xiaodong.Operational accuracy representation of logarithmic amplifier[J].Electronic Technology,1985,(5):45.(in Chinese)鞠晓东.对数放大器运算精度表示法[J].电子技术,1985,(5):45.