高压瓷质绝缘子红外检测盲区分析
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摘要
针对实际检测中存在绝缘子串中劣化绝缘子漏报问题,提出一种基于戴维南等效电路法的红外检测盲区计算方法。在分析盘型悬式绝缘子电压分布的基础上,着重考虑绝缘子红外检测盲区的范围并进行定量的分析。结果表明:电压分布和温度差范围是影响盲区范围大小的两大核心因素,并得到盲区范围和2者的变化曲线。根据检测盲区变化规律,提出绝缘子串分段处理,温度范围差异选择等一系列减小红外检测盲区的方法。检测盲区的确定对红外检测技术的应用有巨大的促进作用;检测盲区的减少,对发现严重劣化绝缘子,提高红外检测的准确率和减少电网故障有重要指导意义。
In order to solve false negative problems of the insulator detection, we propose a method to compute the blind areas of the infrared detection by using the Thevenin equivalent circuit method.In the process of quantitatively analyzing the disc suspension insulator voltage distribution, we take the infrared detection blind areas range into consideration.The results show that voltage distribution and temperature range are two core influential factors of the infrared blind areas detection, at the same time, the variation curves between the two factors and the blind areas are also found. On the basis of blind areas variation detection data,we propose some methods to narrow blind areas such as segmenting insulator strings while detecting and choosing different temperature ranges and so on. Finding the range of blind areas will facilitate the application of infrared detection technology. Narrowing the blind areas will be of great guiding significance to the discovery of severe deterioration of the insulator and the improvement in the accuracy of infrared detection and reduction of the grid failure.
In order to solve false negative problems of the insulator detection, we propose a method to compute the blind areas of the infrared detection by using the Thevenin equivalent circuit method.In the process of quantitatively analyzing the disc suspension insulator voltage distribution, we take the infrared detection blind areas range into consideration.The results show that voltage distribution and temperature range are two core influential factors of the infrared blind areas detection, at the same time, the variation curves between the two factors and the blind areas are also found. On the basis of blind areas variation detection data,we propose some methods to narrow blind areas such as segmenting insulator strings while detecting and choosing different temperature ranges and so on. Finding the range of blind areas will facilitate the application of infrared detection technology. Narrowing the blind areas will be of great guiding significance to the discovery of severe deterioration of the insulator and the improvement in the accuracy of infrared detection and reduction of the grid failure.
引文
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[15]张锐,黄道春,吴光亚,等.1 000 k V支柱瓷绝缘子自然积污规律实验研究[J].高电压技术,2015,41(11):3679-3686.ZHANG Rui,HUANG Daochun,WU Guangya,et al.Experimental research on natural contamination rules of 1 000 k V post porcelain insulator[J].High Voltage Engineering,2015,41(11):3679-3686.
[16]陈永辉,蔡葵.供电设备红外诊断技术[M].北京:中国水利水电出版社,2005:75-80.CHEN Yonghui,CAI Kui.Infrared diagnosis technology of power equipment[M].Beijing,China:China Water Power Press,2005:75-80.
[2]张志劲,张东东,袁超,等.污秽成分对XP-160绝缘子串交流闪络特性的影响[J].高电压技术,2014,40(7):1970-1976.ZHANG Zhijin,ZHANG Dongdong,YUAN Chao,et al.Effect of contamination component on AC flashover performance of insulator string XP-160[J].High Voltage Engineering,2014,40(7):1970-1976.
[3]袁小娴.110 k V线路绝缘子串电压分布和电场分布的研究[D].武汉:华中科技大学,2007:13-18.YUAN Xiaoxian.Study on voltage distribution and electric field distribution of insulator strings of 110 k V transmission line[D].Wuhan,China:Huazhong University of Science and Technology,2007:13-18.
[4]KONTARGYRI V T,STATHOPULOS I A.Measurement and simulation of the voltage distribution and the electric field on aglass insulator string[J].Measurement,2008,41(5):471-480.
[5]樊亚东,文习山,李晓萍,等.复合绝缘子和玻璃绝缘子电位分布的数值仿真[J].高电压技术,2005,31(12):1-3.FAN Yadong,WEN Xishan,LI Xiaoping,et al.Numerical simulation of electric potential distribution of composite insulator and glass insulator[J].High Voltage Engineering,2005,31(12):1-3.
[6]蒋兴良,黄斌,苑吉河,等.电网络法计算交流特高压绝缘子串电压分布[J].高电压技术,2008,34(1):7-10.JIANG Xingliang,HUANG Bin,YUAN Jihe,et al.Calculation of voltage distribution along insulator strings of UHV AC transmission line by electric-network method[J].High Voltage Engineering,2008,34(1):7-10.
[7]姚建刚,关石磊,陆佳政,等.相对温度分布特征与人工神经网络相结合的零值绝缘子识别方法[J].电网技术,2012,36(2):170-175.YAO Jiangang,GUAN Shilei,LU Jiazheng,et al.Identification of zero resistance insulators by combining relative temperature distribution characteristics with artificial neural network[J].Power System Technology,2012,36(2):170-175.
[8]夏德分.红外热像检测零值绝缘子影响因素研究[D].长沙:湖南大学,2012:6-8.XIA Defen.Research on influence factors of zero-resistance insulator detection based on infrared thermal image[D].Changsha,China:Hunan University,2012:6-8.
[9]胡世征.劣化绝缘子的发热机理及热象特征[J].电网技术,1997,21(10):44-46.HU Shizheng.Heating mechanism and thermograph of degradatedinsulators[J].Power System Technology,1997,21(10):44-46.
[10]张友鹏,伍亚萍,董海燕,等.基于遗传算法的绝缘子泄漏电流估算[J].高电压技术,2015,41(8):2757-2763.ZHANG Youpeng,WU Yaping,DONG Haiyan,et al.Evaluation of leakage current of insulators based on the genetic algorithm[J].High Voltage Engineering,2015,41(8):2757-2763.
[11]MIZUNO Y,NAITO K.Voltage and temperature distribution along semiconducting glaze insulator strings[J].IEEE Transactions on Dielectrics and Electrical Insulation,1999,6(1):100-104.
[12]李佐胜,李文利,姚建刚,等.应用绝缘子红外热像处理的现场污秽等级检测方法[J].中国电机工程学报,2010,30(4):132-138.LI Zuosheng,LI Wenli,YANG Jiangang,et al.On-site detection of pollution level of insulators based on infrared-thermal-image processing[J].Power System Technology,2010,33(4):132-138.
[13]梁飞,MACALPINE M,关志成,等.基于红外热像分析的绝缘子污闪过程中干区形成过程分析[J].高电压技术,2014,40(1):138-146.LIANG Fei,MACALPINE M,GUAN Zhicheng,et al.Formation of dry-band in the process of pollution flashover based on infrared thermal image analysis[J].High Voltage Engineering,2014,40(1):138-146.
[14]金光熙,权光日.高压绝缘子串电压分布以及表面温升的理论研究[J].北华大学学报:自然科学版,2011,12(6):733-736.JIN Guangxi,QUAN Guangri.Theoretical study of the voltage distributionand the surface temperature rise of high voltage insulator strings[J].Journal of Beihua University:Natural Science,2011,12(6):733-736.
[15]张锐,黄道春,吴光亚,等.1 000 k V支柱瓷绝缘子自然积污规律实验研究[J].高电压技术,2015,41(11):3679-3686.ZHANG Rui,HUANG Daochun,WU Guangya,et al.Experimental research on natural contamination rules of 1 000 k V post porcelain insulator[J].High Voltage Engineering,2015,41(11):3679-3686.
[16]陈永辉,蔡葵.供电设备红外诊断技术[M].北京:中国水利水电出版社,2005:75-80.CHEN Yonghui,CAI Kui.Infrared diagnosis technology of power equipment[M].Beijing,China:China Water Power Press,2005:75-80.