摘要
对具有"高成本、破坏性"计数型产品的可靠性验收试验,序贯检验方案的样本量截尾值对试验的成本预算起着决定性作用.为降低试验的成本预算,本文对最小样本量截尾值序贯检验(minimum truncated sample size sequential test, MTST)进行研究,给出MTST的定义、性质及求解方法.通过与目前广泛采用的国际标准IEC1123及序贯网图检验进行比较,结果表明MTST显著地减少了样本量截尾值.为进一步减少序贯检验的样本量截尾值,当已知产品质量的先验信息时,本文研究了Bayes最小样本量截尾值序贯检验方案(Bayesian minimum truncated sample size sequential test, BMTST),与MTST的比较表明, BMTST极大地减少了序贯检验的样本量截尾值及平均试验次数,能更好地缩减"高成本、破坏性"产品的试验成本预算及平均试验费用.
For the high-cost and destructive reliability acceptance test, the truncated sample size is a determining factor for its experimental cost budget. In this paper, the minimum truncated sample size sequential test(MTST)is studied. We present the definitions, the properties and the solution method of MTST. Through comparing with International Electrotechnical Commission(IEC) standard IEC1123 and sequential mesh test(SMT), the results show that MTSTs can reduce truncated sample size significantly. When a priori information about the product is known, in order to reduce the truncated sample size of the test further more, Bayesian minimum truncated sample size sequential test(BMTST) is studied. The cases studied show that, comparing with MTSTs, BMTSTs can largely reduce the truncated sample size and the average sample number simultaneously. Therefore, for the high-cost and destructive products, BMTSTs can greatly reduce the product experimental budget and the average test cost at the same time.
引文
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