150 kHz～30 MHz容性电压探头设计
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摘要
为满足复杂电子系统的工作中无损电压测量需求,依据GB/T 6113.102-2018,研制了容性电压探头,探头工作频率150 kHz～30 MHz,检测电压范围10 mV～10 V。介绍电压探头的结构和工作原理,根据指定的分压系数和阻抗要求设计了同轴电极和阻抗变换电路。实测结果表明:容性电压探头输出电压平坦性在0.5 dB以内;被测线缆位置偏移4 mm以内,S21的测试误差小于1 dB;探头输出电压线性度较好。
In order to meet the requirements of non-destructive voltage measurement in the work of complex electronic systems, a capacitive voltage probe has been developed according to GB/T 6113.102-2018. The probe operating frequency is 150 kHz～30 MHz, and the detection voltage range is 10 mV～10 V. The structure and working principle of the voltage probe are introduced. The coaxial electrode and impedance conversion circuit are designed according to the requirements of voltage dividing coefficient and impedance. The measured results show that the output voltage flatness of the capacitive voltage probe is within 0.5 dB; when the measured cable position offset is within 4 mm, the test error of S_(21) is less than 1 dB; the linearity of the probe output voltage is good.
In order to meet the requirements of non-destructive voltage measurement in the work of complex electronic systems, a capacitive voltage probe has been developed according to GB/T 6113.102-2018. The probe operating frequency is 150 kHz～30 MHz, and the detection voltage range is 10 mV～10 V. The structure and working principle of the voltage probe are introduced. The coaxial electrode and impedance conversion circuit are designed according to the requirements of voltage dividing coefficient and impedance. The measured results show that the output voltage flatness of the capacitive voltage probe is within 0.5 dB; when the measured cable position offset is within 4 mm, the test error of S_(21) is less than 1 dB; the linearity of the probe output voltage is good.
引文
[1]中国电子技术标准化研究院,工业和信息化部电子第五研究所,苏州泰思特电子科技有限公司,等. GB/T 6113.102-2018无线电骚扰和抗扰度测量设备和测量方法规范第1-2部分:无线电骚扰和抗扰度测量设备传导骚扰测量的耦合装置[S].北京:中国标准出版社, 2018.
[2]Choi P, Favre M. A fast capacitive voltage monitor for low impedance pulse lines[C]//IEEE International Pulsed Power Conference. Albuquerque:IEEE, 1995.
[3]Hiroshima Y, Miyashita S, Kuwabara N. Method of measuring conducted disturbance using both capacitive voltage probe and current probe[C]//International Symposium on Electromagnetic Compatibility. Tokyo:IEEE, 1999.
[4]杨建国.你好,放大器:初识篇[M].北京:科学出版社,2005.
[2]Choi P, Favre M. A fast capacitive voltage monitor for low impedance pulse lines[C]//IEEE International Pulsed Power Conference. Albuquerque:IEEE, 1995.
[3]Hiroshima Y, Miyashita S, Kuwabara N. Method of measuring conducted disturbance using both capacitive voltage probe and current probe[C]//International Symposium on Electromagnetic Compatibility. Tokyo:IEEE, 1999.
[4]杨建国.你好,放大器:初识篇[M].北京:科学出版社,2005.