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反应溅射法制备AZO薄膜的结构和透明导电性能
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  • 英文篇名:Structure and Transparent Conductive Properties of AZO Thin Films Prepared by Reactive Magnetron Sputtering
  • 作者:祝柏林 ; 李昆鹏 ; 谢挺 ; 吴隽
  • 英文作者:ZHU Bai-lin;LI Kun-peng;XIE Ting;WU Jun;State Key Laboratory of Refractories and Metallurgy,Wuhan University of Science and Technology;
  • 关键词:复合靶材 ; 反应溅射 ; AZO薄膜 ; 透明导电性 ; 禁带宽度 ; 品质因子
  • 英文关键词:composite target;;reactive sputtering;;AZO thin film;;transparent conductive property;;bandgap(Eg);;figure of merit(FOM)
  • 中文刊名:RGJT
  • 英文刊名:Journal of Synthetic Crystals
  • 机构:武汉科技大学省部共建耐火材料与冶金国家重点实验室;
  • 出版日期:2019-03-15
  • 出版单位:人工晶体学报
  • 年:2019
  • 期:v.48;No.245
  • 基金:材料成型与模具技术国家重点实验室开放基金(P2014-06)
  • 语种:中文;
  • 页:RGJT201903012
  • 页数:7
  • CN:03
  • ISSN:11-2637/O7
  • 分类号:80-86
摘要
不同于常用的金属或氧化物靶材,本研究以表面粘贴Al片的Zn/Zn O混合物(Al@Zn/Zn O)为靶材,在衬底温度(Ts)为150℃和300℃,溅射气氛为Ar+O2和Ar+H2下反应溅射制备Al掺杂Zn O(AZO)薄膜。通过干涉显微镜、XRD、Hall效应测试仪、紫外-可见分光光度计研究了Ts以及O2和H2流量对薄膜结构及透明导电性能的影响。结果发现,随O2流量增加,两种Ts下制备的AZO薄膜保持(002)择优取向,薄膜中压应力呈下降的趋势,而薄膜结晶度趋向于先增加后略有下降。薄膜的导电性能随O2流量增加呈逐渐增强的趋势。当O2流量高于一定值时,薄膜可以获得较高的可见光透过率,因此达到较高的品质因子。当Ts从150℃增加到300℃,薄膜的压应力降低,结晶度提高,但导电性未见明显提高。另外,薄膜禁带宽度主要由薄膜中压应力决定。与Ar+O2下制备的AZO薄膜相比,Ar+H2气氛下制备的薄膜基本上为非晶态,其导电性能差,而可见光透过率较高、禁带宽度较大。
        Different from usually used metal or oxide target,Zn/Zn O mixture with surface attached with Al strips( Al@ Zn/Zn O) was used as target in this paper. With this target,Al-doped Zn O( AZO) thin films were prepared by magnetron sputtering under atmosphere of Ar + O2 and Ar + H2 at substrate temperature( Ts) of 150 ℃ and 300 ℃. The effects of Tsand reactive gas( O2 or H2) flux on the structure and transparent conductive properties of the films were investigated by interference microscope,XRD,Hall effect measurement system and UV-Vis spectrophotometer. When the deposition atmosphere is Ar + O2,the results indicate that the AZO films deposited at both Tskeep( 002) preferred orientation,the compressive stress in the films tends to decrease,and the film crystallinity tends to first improve and then slightly degrade with increasing O2 flux. The conductive properties of the films trend to improve as O2 flux increases. When O2 flux is above a certain value,the films can be achieved with higher visible light transmittance,and thus the films with higher FOM are obtained. As Tsincreases from 150 ℃ to 300℃,the compressive stress decreases,film crystallinity improves,but the conductivity has not obvious change. It is found that the bandgap( Eg) of AZO films is mainly due to their compressive stress. When the deposition atmosphere is Ar + H2,most films are amorphous,and the films show poorer conductivity,higher visible light transmittance,and wider bandgap compared with the films deposited under Ar + O2.
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