Cumulative material damage from train of ultrafast infrared laser pulses
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摘要
We developed a systematic experimental method to demonstrate that damage threshold fluence(DTF) for fused silica changes with the number of femtosecond laser(800 nm, 65 ± 5 fs, 10 Hz and 600 Hz) pulses. Based on the experimental data, we were able to develop a model which indicates that the change in DTF varies with the number of shots logarithmically up to a critical value. Above this value, DTF approaches an asymptotic value. Both DTF for a single shot and the asymptotic value as well as the critical value where this happens, are extrinsic parameters dependent on the configuration(repetition rate, pressure and geometry near or at the surface). These measurements indicate that the power of this dependence is an intrinsic parameter independent of the configuration.
We developed a systematic experimental method to demonstrate that damage threshold fluence(DTF) for fused silica changes with the number of femtosecond laser(800 nm, 65 ± 5 fs, 10 Hz and 600 Hz) pulses. Based on the experimental data, we were able to develop a model which indicates that the change in DTF varies with the number of shots logarithmically up to a critical value. Above this value, DTF approaches an asymptotic value. Both DTF for a single shot and the asymptotic value as well as the critical value where this happens, are extrinsic parameters dependent on the configuration(repetition rate, pressure and geometry near or at the surface). These measurements indicate that the power of this dependence is an intrinsic parameter independent of the configuration.
We developed a systematic experimental method to demonstrate that damage threshold fluence(DTF) for fused silica changes with the number of femtosecond laser(800 nm, 65 ± 5 fs, 10 Hz and 600 Hz) pulses. Based on the experimental data, we were able to develop a model which indicates that the change in DTF varies with the number of shots logarithmically up to a critical value. Above this value, DTF approaches an asymptotic value. Both DTF for a single shot and the asymptotic value as well as the critical value where this happens, are extrinsic parameters dependent on the configuration(repetition rate, pressure and geometry near or at the surface). These measurements indicate that the power of this dependence is an intrinsic parameter independent of the configuration.
引文
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29.K.Soong,R.L.Byer,E.R.Colby,R.J.England,and E.A.Peralta,AIP Conf.Proc.1507,511(2012).
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31.Q.Sun,H.B.Jiang,Y.Liu,Y.H.Zhou,H.Yang,and Q.H.Gong,Chin.Phys.Lett.23,189(2006).
32.D.von der Linde and H.Schuler,J.Opt.Soc.Am.B 13,216(1996).
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36.L.A.Emmert,M.Mero,and W.Rudolph,J.Appl.Phys.108,043523(2010).
37.W.Rudolph,L.Emmert,Z.Sun,D.Patel,and C.Menoni,Proc.SPIE 8885,888516(2013).
38.R.A.Negres,M.D.Feit,and S.G.Demos,Opt.Express 18,74(2010).
39.Z.Sun,M.Lenzner,and W.Rudolph,J.Appl.Phys.117,073102(2015).
40.A.Hanuka,L.Sch¨achter,K.P.Wootton,Z.Wu,K.Soong,I.V.Makasyuk,and R.J.England,in Proceedings of IPAC2016(2016),p.4066.
41.L.A.Emmert,M.Mero,D.N.Nguyen,W.Rudolph,D.Patel,E.Krous,and C.S.Menoni,Proc.SPIE 7842,784211(2010).
42.Y.Takigawa,K.Kurosawa,W.Sasaki,K.Yoshida,E.Fujiwara,and Y.Kato,J.Non-Cryst.Solids 116,293(1990)2.
43.A.Hanuka and L.Sch¨achter,Phys.Rev.Accel.21,54001(2018).
2.R.J.England,R.J.Noble,B.Fahimian,B.Loo,E.Abel,A.Hanuka,and L.Schachter,AIP Conf.Proc.1777,060002(2016).
3.X.Liu,D.Du,and G.Mourou,IEEE J.Quantum Electron.33,1706(1997).
4.B.Stuart,M.Feit,S.Herman,A.Rubenchik,B.Shore,and M.Perry,Phys.Rev.B 53,1749(1996)1.
5.C.W.Carr,H.B.Radousky,and S.G.Demos,Phys.Rev.Lett.91,127402(2003).
6.M.Mero,J.Liu,W.Rudolph,D.Ristau,and K.Starke,Phys.Rev.B 71,115109(2005).
7.B.Chimier,O.Ut′eza,N.Sanner,M.Sentis,T.Itina,P.Lassonde,F.L′egar′e,F.Vidal,and J.C.Kieffer,Phys.Rev.B 84,094104(2011).
8.J.Bude,P.Miller,S.Baxamusa,N.Shen,T.Laurence,W.Steele,T.Suratwala,L.Wong,W.Carr,D.Cross,and M.Monticelli,Opt.Express 22,5839(2014).
9.T.a Laurence,J.D.Bude,S.Ly,N.Shen,and M.D.Feit,Opt.Express 20,11561(2012).
10.Y.Jee,F.M.Becker,and M.R.Walser,J.Opt.Soc.Am.B 5,648(1988).
11.F.Di Niso,C.Gaudiuso,T.Sibillano,F.P.Mezzapesa,A.Ancona,and P.M.Lugar`a,Opt.Express 22,12200(2014).
12.F.Liang,R.Vall′ee,D.Gingras,and S.L.Chin,Opt.Mater.Express 1,1244(2011).
13.G.Raciukaitis,M.Brikas,P.Gecys,and M.Gedvilas,Proc.SPIE 7005,70052L(2008).
14.P.T.Mannion,J.Magee,E.Coyne,G.M.OConnor,and T.J.Glynn,Appl.Surf.Sci.233,275(2004).
15.A.Mouskeftaras,S.Guizard,N.Fedorov,and S.Klimentov,Appl.Phys.A 110,709(2013).
16.M.Lenzner,J.Kr¨uger,S.Sartania,Z.Cheng,Ch.Spielmann,G.Mourou,W.Kautek,and F.Krausz,Phys.Rev.Lett.80,4076(1998).
17.D.Ashkenasi,M.Lorenz,R.Stoian,and A.Rosenfeld,Appl.Surf.Sci.150,101(1999).
18.A.Rosenfeld,M.Lorenz,R.Stoian,and D.Ashkenasi,Appl.Phys.A 69,373(1999).
19.F.Liang,Q.Sun,D.Gingras,R.Vall′ee,and S.L.Chin,Appl.Phys.Lett.96,101903(2010).
20.J.Bonse,J.M.Wrobel,J.Kr¨uger,and W.Kautek,Appl.Phys.A 72,89(2001).
21.A.C.Tien,S.Backus,H.Kapteyn,M.Murnane,and G.Mourou,Phys.Rev.Lett.82,3883(1999).
22.D.Du,X.Liu,G.Korn,J.Squier,and G.Mourou,Appl.Phys.Lett.64,3071(1994).
23.K.Zhang,L.Jiang,X.Li,X.Shi,D.Yu,L.Qu,and Y.Lu,J.Phys.D 47,435105(2014).
24.J.Roth,E.Tsitrone,A.Loarte,T.Loarer,G.Counsell,R.Neu,V.Philipps,S.Brezinsek,M.Lehnen,P.Coad,C.Grisolia,K.Schmid,K.Krieger,A.Kallenbach,B.Lipschultz,R.Doerner,R.Causey,V.Alimov,W.Shu,O.Ogorodnikova,A.Kirschner,G.Federici,and A.Kukushkin,J.Nucl.Mater.390-391,1(2009).
25.E.A.Peralta and Rl Byer,in Proceedings of the 2011 Particle Accelerator Conference(2011),p.280.
26.R.D.Allen,G.B.David,and G.Nomarski,Z.Wiss.Mikrosk.Mikrosk.Tech.69,193(1969).
27.W.C.Nixon,Microelectron.Reliab.4,55(1965).
28.C.Li,Y.Zhao,Y.Cui,Y.Wang,X.Peng,C.Shan,M.Zhu,J.Wang,and J.Shao,Opt.Laser Technol.106,372(2018).
29.K.Soong,R.L.Byer,E.R.Colby,R.J.England,and E.A.Peralta,AIP Conf.Proc.1507,511(2012).
30.D.Nguyen,L.Emmert,P.Schwoebel,D.Patel,C.Menoni,M.Shinn,and W.Rudolph,Opt.Express 19,5690(2011).
31.Q.Sun,H.B.Jiang,Y.Liu,Y.H.Zhou,H.Yang,and Q.H.Gong,Chin.Phys.Lett.23,189(2006).
32.D.von der Linde and H.Schuler,J.Opt.Soc.Am.B 13,216(1996).
33.K.Soong,R.Byer,C.McGuinness,E.A.Peralta,and E.Colby,in Proceedings of the 2011 Particle Accelerator Conference(2011),p.277.
34.L.V.Keldysh,J.Exptl.Theoret.Phys.47,1945(1964).
35.S.I.Anisimov,N.M.Bityurin,and B.S.Luk’yanchuk,in Photo-Excited Processes,Diagnostics and Applications:Fundamentals and Advanced Topics,A.Peled(ed.)(Springer,2003),p.121.
36.L.A.Emmert,M.Mero,and W.Rudolph,J.Appl.Phys.108,043523(2010).
37.W.Rudolph,L.Emmert,Z.Sun,D.Patel,and C.Menoni,Proc.SPIE 8885,888516(2013).
38.R.A.Negres,M.D.Feit,and S.G.Demos,Opt.Express 18,74(2010).
39.Z.Sun,M.Lenzner,and W.Rudolph,J.Appl.Phys.117,073102(2015).
40.A.Hanuka,L.Sch¨achter,K.P.Wootton,Z.Wu,K.Soong,I.V.Makasyuk,and R.J.England,in Proceedings of IPAC2016(2016),p.4066.
41.L.A.Emmert,M.Mero,D.N.Nguyen,W.Rudolph,D.Patel,E.Krous,and C.S.Menoni,Proc.SPIE 7842,784211(2010).
42.Y.Takigawa,K.Kurosawa,W.Sasaki,K.Yoshida,E.Fujiwara,and Y.Kato,J.Non-Cryst.Solids 116,293(1990)2.
43.A.Hanuka and L.Sch¨achter,Phys.Rev.Accel.21,54001(2018).