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基于热峰模型的单粒子效应模拟研究
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  • 英文篇名:Simulation of Single Event Effect by a Thermal Spike Model
  • 作者:彭海波 ; 管明 ; 王铁山 ; 赵江涛 ; 郭红霞
  • 英文作者:PENG Haibo;GUAN Ming;WANG Tieshan;ZHAO Jiangtao;GUO Hongxia;School of Nuclear Science and Technology,Lanzhou University;Key Laboratory of Special Function Materials and Structure Design Ministry of Education,Lanzhou University;State Key Laboratory of Intense Pulsed Radiation Simulation and Effect (SKLIPRSE);
  • 关键词:热峰效应 ; 单粒子效应 ; 载流子浓度
  • 英文关键词:thermal spike effect;;single event effect;;carrier density
  • 中文刊名:HWDT
  • 英文刊名:Nuclear Physics Review
  • 机构:兰州大学核科学与技术学院;兰州大学教育部特殊功能材料与结构设计重点实验室;强脉冲辐射环境模拟与效应国家重点实验室;
  • 出版日期:2019-07-30 10:17
  • 出版单位:原子核物理评论
  • 年:2019
  • 期:v.36;No.142
  • 基金:国家自然科学基金资助项目(11505085);; 中央高校基本科研业务费项目(lzujbky-2018-72);; 甘肃省引导科技创新发展专项资金项目(2018ZX-07);; 强脉冲辐射环境模拟与效应国家重点实验室专项经费资助项目(SKLIPR1708)~~
  • 语种:中文;
  • 页:HWDT201902018
  • 页数:6
  • CN:02
  • ISSN:62-1131/O4
  • 分类号:126-131
摘要
单粒子效应是航天电子器件失效的重要原因,研究其物理过程对航天电子器件寿命预测、器件抗辐照加固有着重要的意义。现有的模型多从线性能量沉积的角度来解释单粒子翻转,因此无法解释单粒子效应地面实验模拟过程中的温度效应。建立了一个新模型,从高能带电离子与材料相互作用的物理过程出发,通过解三维的热扩散方程,计算出能量在材料中沉积、交换、扩散,得到电子和晶格温度的空间分布以及时间演化过程。推断出离子辐照过程中导致的自由电子浓度和收集电荷随LET的变化关系。此模型解释了单粒子效应中随着器件温度升高,单粒子效应截面增加的现象。
        Single event effect(SEE) is an important reason that induces failures in space electronic components.Explanations of physical process are important to life evaluation of electronic devices and radiation hardening.Many models, in which cross section of SEE was related to the linear energy transfer(LET), were presented.However, according those models, temperature effects could not be explained. A new model, which is based on interactions of high-energy ion with material, is proposed. This model is employed to calculate the energy deposition, exchange and diffusion in material. The temperatures electron and lattice are obtained from thermal diffusion equations. Evolutions of electron and lattice with space and time are presented. The model suggested the concentration of free electrons and total collected charge induced by irradiation of ions were function of LET.The model explained an experimental effect that the cross sections of SEE increased with the temperature of device.
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