KPFM测试参数对表面电势测量的影响
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摘要
开尔文探针力显微镜(KPFM)是一种可以对材料表面电势进行纳米级成像的工具,是研究纳米材料表面特性的一种重要手段。高定向热解石墨(HOPG)具有表面光滑、导电性好的特点,在原子力显微镜(AFM)的KPFM模式下,向HOPG表面施加不同电压,测量HOPG的表面电势,以结果作为参照,采用控制变量法分别对比了滤波器阶数、灵敏度和驱动值三种参数对表面电势测量的影响。实验结果表明:滤波器阶数、灵敏度和驱动值均对表面电势的测量有不同程度的影响,不同程度增加滤波器阶数、灵敏度和驱动值都可以起到提升信噪比的作用,其中灵敏度的提升对信号的影响最为显著。
The Kelvin probe force microscopy(KPFM)is a nanometer-scale imaging tool of the surface potential on the materials,and is an important method to research the surface characteristics of nanomaterials.The highly oriented pyrolytic graphite(HOPG)has the characteristics of the smooth surface and good conductivity.In the KPFM mode of the atomic force microscope(AFM),the surface potential of the HOPG was measured by applying different voltages to the HOPG surface.With the results as the reference,the influences of three parameters,i.e.the filter order,sensitivity and driving value on the measurement of the surface potential were compared by using the control variable method.The experiment results show that the filter order,sensitivity and driving value affect the measurement of the surface potential differently.And the signal-to-noise ratio can be improved by increasing the filter order,sensitivity and driving value in varying degrees,among which the enhancement of the sensitivity has the most significant effect on the signal.
The Kelvin probe force microscopy(KPFM)is a nanometer-scale imaging tool of the surface potential on the materials,and is an important method to research the surface characteristics of nanomaterials.The highly oriented pyrolytic graphite(HOPG)has the characteristics of the smooth surface and good conductivity.In the KPFM mode of the atomic force microscope(AFM),the surface potential of the HOPG was measured by applying different voltages to the HOPG surface.With the results as the reference,the influences of three parameters,i.e.the filter order,sensitivity and driving value on the measurement of the surface potential were compared by using the control variable method.The experiment results show that the filter order,sensitivity and driving value affect the measurement of the surface potential differently.And the signal-to-noise ratio can be improved by increasing the filter order,sensitivity and driving value in varying degrees,among which the enhancement of the sensitivity has the most significant effect on the signal.
引文
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[2]ZHANG Q H.Progress on TiO2-based nanomaterials and its utilization in the clean energy technology[J].Journal of Inorganic Materials,2012,27(1):1-10.
[3]MULYUKOV R R,IMAYEV R M,NAZAROV A A.Production,properties and application prospects of bulk nanostructured materials[J].Journal of Materials Science,2008,43(23/24):7257-7263.
[4]KHIN M M,NAIR A S,BABU V J,et al.A review on nanomaterials for environmental remediation[J].Energy and Environmental Science,2012,5(8):8075-8109.
[5]车玉萍,翟锦.新型纳米材料/结构在光电转化中的应用[J].中国科学:化学,2015(3):262-282.
[6]扎热木,萨迪克,都颖,等.纳米材料在电化学生物传感器中的应用[J].分析科学学报,2009,25(2):217-222.
[7]于凉云,张奇,袁淑军.原子力显微镜(AFM)应用于纳米科学中的研究进展[J].山东化工,2016,45(24):39-43.
[8]SCHULER B,MEYER G,PEA D,et al.Unraveling the molecular structures of asphaltenes by atomic force microscopy[J].Journal of the American Chemical Society,2015,137(31):9870-9876.
[9]BUTT H J,CAPPELLA B,KAPPL M.Force measurements with the atomic force microscope:technique,interpretation and applications[J].Surface Science Reports,2005,59(1):1-152.
[10]OBATAYA I,NAKAMURA C,HAN S,et al.Nanoscale operation of a living cell using an atomic force microscope with a nanoneedle[J].Nano Letters,2005,5(5):27-30.
[11]BARTH C,HYNNINEN T,BIELETZKI M,et al.AFMtip characterization by Kelvin probe force microscopy[J].New Journal of Physics,2010,12(3):331-335.
[12]熊晓洋,陈宇航.基于开尔文探针力显微镜的纳米复合材料次表面成像分析[J].纳米技术与精密工程,2016,14(6):402-409.
[13]LIN W H,WU J J,CHOU M M C,et al.Charge transfer in Au nanoparticle-nonpolar ZnO photocatalysts illustrated by surface-potential-derived three-dimensional band diagram[J].Journal of Physical Chemistry:C,2014,118(34):19814-19821.
[14]MELITZ W,SHEN J,KUMMEL A C,et al.Kelvin probe force microscopy and its application[J].Surface Science Reports,2011,66(1):1-27.
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