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基于超声相控阵衍射波图像的缺陷测量方法
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  • 英文篇名:A defect measurement method based on ultrasonic phased array diffraction wave image
  • 作者:陈振华 ; 许倩 ; 卢超
  • 英文作者:CHEN Zhenhua;XU Qian;LU Chao;Key Laboratory of Nondestructive Testing of Ministry of Education,Nanchang Hangkong Universtiy;
  • 关键词:超声相控阵 ; 扇型扫描 ; 衍射波 ; 定量检测
  • 英文关键词:Ultrasonic phased array;;Sector scan;;Diffraction wave;;Quantitative detection
  • 中文刊名:YYSN
  • 英文刊名:Journal of Applied Acoustics
  • 机构:南昌航空大学无损检测技术教育部重点实验室;
  • 出版日期:2018-07-09 09:45
  • 出版单位:应用声学
  • 年:2018
  • 期:v.37
  • 基金:国家自然科学基金项目(11664027,11374134);; 江西省自然科学基金项目(20161BAB216101)
  • 语种:中文;
  • 页:YYSN201804001
  • 页数:8
  • CN:04
  • ISSN:11-2121/O4
  • 分类号:5-12
摘要
工程应用中常通过超声相控阵检测技术的脉冲反射法对缺陷进行扇形扫描,并基于反射波幅度的6 d B法测量缺陷尺寸。然而,6 d B测长方法很难对缺陷尺寸进行精确测量。该研究提出利用超声相控扇扫图中的缺陷衍射波图像测量缺陷尺寸以获得较高的测量精度。首先,分析了扇扫图像中缺陷衍射波特征图像及其影响参数以获得清晰的缺陷衍射波扇型扫描图像;其次,提出了基于端部衍射波时差的缺陷尺寸测量方法,并与其他测量方法的测量精度相比较。研究结果显示:基于相控阵扇型扫描的缺陷衍射波测长精度较之反射波幅度法更高,而反射波法更适用于缺陷取向的测量。该研究经过对比分析,为缺陷定量检测提供了一种更为有效的解决方案。
        In engineering applications, the sector scan of ultrasonic phased array method is used to test the defect, in which the defect size is measured by the 6 d B method. However, it is difficult to measure the size of the defect accurately based on the 6 d B length measurement method of the reflected wave amplitude. In the study, we proposed to use the image of defect's diffraction wave in the ultrasonic phased sector scanning image to measure the defect's size with higher measurement accuracy. Firstly, the image's characteristics of diffraction wave and related influence factors are analyzed to achieve higher quality of the image. Secondly, the measurement method of defect size based on diffraction wave is proposed and compared with the other methods.The research results show that the measurement accuracy of the defect diffraction wave is higher than that of the reflected wave amplitude method, and the reflected wave method is more suitable for the measurement of defect's orientation. The study provides a more effective solution for the quantitative detection of defects.
引文
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