用户名: 密码: 验证码:
基于主瓶颈设备利用率的并行半导体生产线投料控制策略
详细信息    查看官网全文
摘要
半导体生产线投料控制策略在半导体制造系统调度中处于非常重要的地位。考虑并行半导体生产线投料控制特点,提出基于主瓶颈设备利用率的并行半导体生产线投料控制策略。该方法与固定在制品(Constant Work In Process,CONWIP)方法相比,可以充分利用每条生产线的主瓶颈设备,提高产出与工件的准时交货率。仿真结果表明,该方法在出片量、加工周期、准时交货率、紧急工件准时交货率这四项性能指标与CONWIP相比最大能提高17.46%、32.90%、85.84%、53.65%。
Release control plays an important role on the manufacturing performance of semiconductor production lines. Considering their characteristics, a release control policy based on the multiple bottleneck workstation utility of parallel semiconductor manufacture lines(abbreviated as Rel_M2) is proposed. Comparing to common release control strategy CONWIP(Constant Work in Process), Rel_M2 can make full use of the primary bottleneck equipment of each line, increase the throughput, and improve the on-time delivery rate. The simulation results demonstrate that the throughput, on-time delivery rate and that of hot job are increased by 17.46%, 85.84% and 53.65%, respectively. Moreover, the mean cycle time is decreased by 32.90%.
引文
[1]曹政才,彭亚珍,李博,刘民.半导体生产线基于DBR和ANFIS相融合的动态调度方法研究,电子学报,43(10):2082-2087,2015.
    [2]郭永辉,邵志芳,钱省三,多重入晶圆制造系统动态投料策略研究.半导体技术,31(9):645-665,2006.
    [3]You Li,Zhibin Jiang and Wenyou Jia.An integrated release and dispatch policy for semiconductor wafer fabrication.International Journal of Production Research.52(8):2275-2292,2014.
    [4]姚丽丽,史海波,刘昶.基于K-modes聚类的半导体封装测试粗日投料控制,计算机集成制造系统,20(7):1743-1750,2014.
    [5]Z.B.Chen,X.W.Pan,L.Li,et al.A New Release Control Policy(WRELM)For Semiconductor Wafer Fabrication Facilities.IEEE 11th International Conference on Networking,Sensing and Control(ICNSC),2014:64-68.
    [6]GLASSEY C R,RESENDE M G C.Closed-loop job shop release control for VLSI circuit manufacturing.IEEE Trans on Semiconductor Manufacturing,1(1):26-46,1988
    [7]张国辉,刘昶,陈海赞,姚丽丽,史海波.基于有约束的最小生成树的半导体封装测试细日投料控制方法.中国发明专利.CN 103399549 B,2015.10.28.
    [8]James C.Chen,Yang-Chih Fan and Chia-Wen Chen.Capacity requirements planning for twin Fabs of wafer fabrication,International Journal of Production Research,vol.47,pp.4473-4496,2009.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700