数模混合电路可测试性的若干问题研究
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摘要
随着微处理器技术及微电子技术的迅猛发展，电路系统的规模和复杂性都急剧上升，印刷电路板的密度不断增加，使得电路系统的测试难度也越来越大。而数模混合电路的广泛应用给现有的测试方法也提出了新的挑战，其可测试性问题成为一个重要的研究课题。本文运用离散事件系统理论(Discrete EventSystem, DES)来进行数模混合电路的可测试性分析，提供了一种对数字电路、模拟电路及数模混合电路测试统一的处理方法。
本文的主要工作及取得的成果如下：
文中系统研究了运用离散事件系统理论测试数模混合电路的数学模型，并验证了其可行性，这样数字电路和模拟电路就能够在一个统一的框架内进行可测试性分析及故障诊断。
在采用DES理论分析数模混合电路时，其中一个重要工作就是求取电路的
最小测试集，以达到减少测试时间、降低测试成本的目的。本文提出将其看作一个组合优化问题，并运用遗传算法和模拟退火算法相结合的混合优化策略来解决，通过编程实现了该算法，达到了同时求取多个最小测试集的效果。
本文针对建立被测电路的DES模型问题，采用EDA工具Multisim2001软件来对被测电路注入故障，进行故障仿真，建立被测电路的故障信息数据库，从而建立被测电路的DES模型，进行后续的处理分析。实验证明，用Multisim2001软件对电路进行故障仿真效果良好。
With the development of the microprocessor technology, especially the micro-electronic technology, the complexity of the circuit system and the density of PCB have increased greatly. This made the test of the circuits more difficult. At the same time, the wide application of the mixed-signal circuits gave a great challenge for the present test methods. The testability of the mixed-signal circuits has become an important research task. This dissertation has researched on applying the recently developed Discrete Event System (DES) theory to analyze the testability of the mixed-signal circuits and provided a systemic method for the digital circuits and the analog circuits.
The main work and contributions of the dissertation are summarized as follows:
Firstly, We researched the mathematics model of mixed-signal circuits based on the DES theory systemically. It was proved that the model was feasible to deal with the fault diagnosis and the testability of the digital and analog parts in the circuits with an uniform frame.
Secondly, When we researched the mixed-signal circuits based on the DES theory, one of the important tasks was to find the minimal test set of the circuit in order to reduce the test time and the test cost. In the dissertation we regarded it as an optimization problem and proposed to solve it based on the hybrid strategy of the genetic algorithm and simulated annealing algorithm. We programmed the algorithm and got many solutions at one time.
Finally, as for building the DES model of the circuits to be tested, we introduced the EDA tool, Multisim2001, to inject the fault to the circuit, simulate the fault and build the fault information database. The experiment proved the fault simulation method based on Multisim2001 was effective.
本文的主要工作及取得的成果如下：
文中系统研究了运用离散事件系统理论测试数模混合电路的数学模型，并验证了其可行性，这样数字电路和模拟电路就能够在一个统一的框架内进行可测试性分析及故障诊断。
在采用DES理论分析数模混合电路时，其中一个重要工作就是求取电路的
最小测试集，以达到减少测试时间、降低测试成本的目的。本文提出将其看作一个组合优化问题，并运用遗传算法和模拟退火算法相结合的混合优化策略来解决，通过编程实现了该算法，达到了同时求取多个最小测试集的效果。
本文针对建立被测电路的DES模型问题，采用EDA工具Multisim2001软件来对被测电路注入故障，进行故障仿真，建立被测电路的故障信息数据库，从而建立被测电路的DES模型，进行后续的处理分析。实验证明，用Multisim2001软件对电路进行故障仿真效果良好。
With the development of the microprocessor technology, especially the micro-electronic technology, the complexity of the circuit system and the density of PCB have increased greatly. This made the test of the circuits more difficult. At the same time, the wide application of the mixed-signal circuits gave a great challenge for the present test methods. The testability of the mixed-signal circuits has become an important research task. This dissertation has researched on applying the recently developed Discrete Event System (DES) theory to analyze the testability of the mixed-signal circuits and provided a systemic method for the digital circuits and the analog circuits.
The main work and contributions of the dissertation are summarized as follows:
Firstly, We researched the mathematics model of mixed-signal circuits based on the DES theory systemically. It was proved that the model was feasible to deal with the fault diagnosis and the testability of the digital and analog parts in the circuits with an uniform frame.
Secondly, When we researched the mixed-signal circuits based on the DES theory, one of the important tasks was to find the minimal test set of the circuit in order to reduce the test time and the test cost. In the dissertation we regarded it as an optimization problem and proposed to solve it based on the hybrid strategy of the genetic algorithm and simulated annealing algorithm. We programmed the algorithm and got many solutions at one time.
Finally, as for building the DES model of the circuits to be tested, we introduced the EDA tool, Multisim2001, to inject the fault to the circuit, simulate the fault and build the fault information database. The experiment proved the fault simulation method based on Multisim2001 was effective.
引文
[1] 温熙森，徐永成，易晓山，徐循 编著．智能机内测试理论与应用．北京：国防工业出版社，2002．
[2] 丁瑾编 著．可靠性与可测性分析设计．北京：北京邮电大学出版社，1996．
[3] 杨吉祥 编著．数据域测试技术及仪器．北京：科学出版社，1990．
[4] 潘中良，熊银根．数字电路故障模块诊断的神经网络方法研究．中山大学学报(自然科学版)，2001．40(4)：51—54．
[5] R.G.Bennetts. Introduction to Digital Board Testing. New York: Crane Russak, 1982.
[6] R.G.Bennetts. Design of Testable Logic Circuits. Massachussets: Addison-Wesley. 1984.
[7] M.A.Breuer, A.D.Friedman. Diagnosis and Reliable Design of Digital Systems. Maryland: Computer Science Press. 1976.
[8] Feng Lin, Lin T W. Diagnosability of discrete event systems and it's applications to circuit testing. Proceeding of 36th. Midwest Symposium on Circuit and Systtems, IEEE, 1993:344～347.
[9] Feng Lin, Zheng Hui Lin, T.William Lin. A Uniform Approach to Mixed-Singal Circuit Test. International Journal of Circuit Theory and Applications, 1997, Vol.25:81-93.
[10] 温熙森，胡政，易晓山，杨拥民．可测试性技术的现状与未来．测控技术．2000，19(1)：9-12．
[11] DOD-HDBK-791. Maintainability Design Techniques, 1988.
[12] MIL-STD-2165A. Testability Program for Systems and Equipment,1993.
[13] IEEE Standard: Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990.
[14] 胡政．边界扫描测试理论与方法研究，博士学位论文．长沙：国防科技大学，1998．
[15] 吴正义，韩云台编著．测试技术．北京：机械工业出版社，1987．
[16] 闵应骅 编著．逻辑电路测试．北京：中国铁道出版社，1986．
[17] 杨士元 编著．数字电路的故障诊断与可靠性设计．北京：清华出版社，1989．
[18] 杨士元 编著．模拟电路的故障诊断与可靠性设计．北京：清华出版社，1993．
[19] 赵国南，郭裕顺 编著．模拟电路故障诊断．哈尔滨：哈尔滨工业大学出版社，1991．
[20] C.C.Wu, K.Nakajima, C.L.Wey, R.Se.aks, Analog Fault Diagnosis With Failure Bounds, IEEE Trans. 1982, CAS-29:277-284.
[21] 郑大钟，赵千川编 著．离散事件动态系统．北京：清华大学出版社，2000．
[22] Feng Lin, John Markee, Bill Rado. Design and Test of Mixed Signal Circuits:A Discrete-Event Approach. Proceddings of the 32nd Conference on Decision and Control, IEEE, 1993:217-222.
[23] 张巍，夏立．用DES理论测试数模混合电路．系统工程与电子技术，2001，23(10)：19-21．
[24] Cassandras C G. Introduction to the Modeling, Control and Optimization of Discrete Event System. Mathmatics and Information, 1995:80-151.
[25] 耿素云，屈婉玲 编著．离散数学．北京：高等教育出版社，1998．
[26] T. Ozawa. Analog Methods for Computer-Aided Circuit Analysis and Diagnosis, Marcel Dekker, New York, 1988.
[27] Z. H. Lin. 'Studies on the fault diagnosis of analog circuits', Ph.D. Thesis, Department of Electronic Engineering, University of Tokyo, 1991.
[28] 章其波．基于DES理论的数模混合电路可测试性研究，硕士学位论文，合肥工业大学，2003． ’
[29] 蒋薇薇．数模混合电路的故障诊断及可测试性研究，硕士学位论文，合肥工业大学，2003．
[30] 张巍，夏立，杨宣仿．基于VXI仪器的电路板故障诊断系统．测控技术，2001，20(11)：57-59．
[31] Kirkatrick S, et al. Optimazation by Simulated Annealing. Science, 1983, 220(4598):671-680.
[32] 王凌 编著．智能优化算法及其应用．北京：清华大学出版社，2001．
[33] 谢云．模拟退火算法综述．微计算机信息，1998，14(5)：66-71．
[34] 康立山 编著．非数值并行算法—模拟退火算法．北京：科学出版社，1994．
[35] Goldberg D e. Genetic Algorithms in Search, Optimization and Machine Learning. Reading, Addision-Wesley, 1989.
[36] 武广号，文毅，乐美峰．遗传算法及其应用．应用力学学报，1996，13(2)：93-98．
[37] 潘中良，陈光瑀．基于遗传进化的优化方法及其在测试中的应用．电子测量与仪器学报，1998，12(1)：12-16．
[38] 周明，孙树栋 编著．遗传算法原理及应用．北京：国防工业出版社，1999．
[39] 孙艳丰，戴春荣．几种随机搜索算法的比较研究．系统工程与电子技术，
1998, 2:43-47.
[40] Lin F T, Kao C Y, Hsu C C. Applying the Genetic Approach to Simulated Annealing in Solving Some NP-hard, IEEE Trans on SMC, 1993, 23(6): 1752-1767.
[41] 吴志远，邵惠鹤，吴新余．遗传退火进化算法．上海交通大学学报，1997，31(12)：69-71．
[42] 王凌，郑大钟．一种GASA混合优化策略．控制理论和应用，2001，18(4)：552-554．
[43] 王凌．混合优化策略与神经网络的若干问题研究，博士学位论文，北京：清华大学，1999．
[44] 蒋卓勤，邓玉元 编著．Multisim2001及其在电子设计中的应用．西安：西安电子科技大学出版社，2003．
[45] 郑步生，吴渭 编著．Multisim2001电路设计及其仿真入门与应用．北京：电子工业出版社，2002．
[46] 马秋明，赵继德等．EDA仿真软件Multisim2001与两级放大电路仿真．高师理科学刊，2003，23(3)：18-20．
[47] 陈永甫 编著．555集成电路应用800例．北京：电子工业出版社，1992．
[48] 阎石 编著．数字电子技术基础(第四版)．北京：高等教育出版社，1998．
[49] 郭淑珍，吕秋芬，李志华，李秀玲．555定时器应用中地问题探讨．河北师范大学学报(自然科学版)，2002，26(2)：149-152．
[2] 丁瑾编 著．可靠性与可测性分析设计．北京：北京邮电大学出版社，1996．
[3] 杨吉祥 编著．数据域测试技术及仪器．北京：科学出版社，1990．
[4] 潘中良，熊银根．数字电路故障模块诊断的神经网络方法研究．中山大学学报(自然科学版)，2001．40(4)：51—54．
[5] R.G.Bennetts. Introduction to Digital Board Testing. New York: Crane Russak, 1982.
[6] R.G.Bennetts. Design of Testable Logic Circuits. Massachussets: Addison-Wesley. 1984.
[7] M.A.Breuer, A.D.Friedman. Diagnosis and Reliable Design of Digital Systems. Maryland: Computer Science Press. 1976.
[8] Feng Lin, Lin T W. Diagnosability of discrete event systems and it's applications to circuit testing. Proceeding of 36th. Midwest Symposium on Circuit and Systtems, IEEE, 1993:344～347.
[9] Feng Lin, Zheng Hui Lin, T.William Lin. A Uniform Approach to Mixed-Singal Circuit Test. International Journal of Circuit Theory and Applications, 1997, Vol.25:81-93.
[10] 温熙森，胡政，易晓山，杨拥民．可测试性技术的现状与未来．测控技术．2000，19(1)：9-12．
[11] DOD-HDBK-791. Maintainability Design Techniques, 1988.
[12] MIL-STD-2165A. Testability Program for Systems and Equipment,1993.
[13] IEEE Standard: Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990.
[14] 胡政．边界扫描测试理论与方法研究，博士学位论文．长沙：国防科技大学，1998．
[15] 吴正义，韩云台编著．测试技术．北京：机械工业出版社，1987．
[16] 闵应骅 编著．逻辑电路测试．北京：中国铁道出版社，1986．
[17] 杨士元 编著．数字电路的故障诊断与可靠性设计．北京：清华出版社，1989．
[18] 杨士元 编著．模拟电路的故障诊断与可靠性设计．北京：清华出版社，1993．
[19] 赵国南，郭裕顺 编著．模拟电路故障诊断．哈尔滨：哈尔滨工业大学出版社，1991．
[20] C.C.Wu, K.Nakajima, C.L.Wey, R.Se.aks, Analog Fault Diagnosis With Failure Bounds, IEEE Trans. 1982, CAS-29:277-284.
[21] 郑大钟，赵千川编 著．离散事件动态系统．北京：清华大学出版社，2000．
[22] Feng Lin, John Markee, Bill Rado. Design and Test of Mixed Signal Circuits:A Discrete-Event Approach. Proceddings of the 32nd Conference on Decision and Control, IEEE, 1993:217-222.
[23] 张巍，夏立．用DES理论测试数模混合电路．系统工程与电子技术，2001，23(10)：19-21．
[24] Cassandras C G. Introduction to the Modeling, Control and Optimization of Discrete Event System. Mathmatics and Information, 1995:80-151.
[25] 耿素云，屈婉玲 编著．离散数学．北京：高等教育出版社，1998．
[26] T. Ozawa. Analog Methods for Computer-Aided Circuit Analysis and Diagnosis, Marcel Dekker, New York, 1988.
[27] Z. H. Lin. 'Studies on the fault diagnosis of analog circuits', Ph.D. Thesis, Department of Electronic Engineering, University of Tokyo, 1991.
[28] 章其波．基于DES理论的数模混合电路可测试性研究，硕士学位论文，合肥工业大学，2003． ’
[29] 蒋薇薇．数模混合电路的故障诊断及可测试性研究，硕士学位论文，合肥工业大学，2003．
[30] 张巍，夏立，杨宣仿．基于VXI仪器的电路板故障诊断系统．测控技术，2001，20(11)：57-59．
[31] Kirkatrick S, et al. Optimazation by Simulated Annealing. Science, 1983, 220(4598):671-680.
[32] 王凌 编著．智能优化算法及其应用．北京：清华大学出版社，2001．
[33] 谢云．模拟退火算法综述．微计算机信息，1998，14(5)：66-71．
[34] 康立山 编著．非数值并行算法—模拟退火算法．北京：科学出版社，1994．
[35] Goldberg D e. Genetic Algorithms in Search, Optimization and Machine Learning. Reading, Addision-Wesley, 1989.
[36] 武广号，文毅，乐美峰．遗传算法及其应用．应用力学学报，1996，13(2)：93-98．
[37] 潘中良，陈光瑀．基于遗传进化的优化方法及其在测试中的应用．电子测量与仪器学报，1998，12(1)：12-16．
[38] 周明，孙树栋 编著．遗传算法原理及应用．北京：国防工业出版社，1999．
[39] 孙艳丰，戴春荣．几种随机搜索算法的比较研究．系统工程与电子技术，
1998, 2:43-47.
[40] Lin F T, Kao C Y, Hsu C C. Applying the Genetic Approach to Simulated Annealing in Solving Some NP-hard, IEEE Trans on SMC, 1993, 23(6): 1752-1767.
[41] 吴志远，邵惠鹤，吴新余．遗传退火进化算法．上海交通大学学报，1997，31(12)：69-71．
[42] 王凌，郑大钟．一种GASA混合优化策略．控制理论和应用，2001，18(4)：552-554．
[43] 王凌．混合优化策略与神经网络的若干问题研究，博士学位论文，北京：清华大学，1999．
[44] 蒋卓勤，邓玉元 编著．Multisim2001及其在电子设计中的应用．西安：西安电子科技大学出版社，2003．
[45] 郑步生，吴渭 编著．Multisim2001电路设计及其仿真入门与应用．北京：电子工业出版社，2002．
[46] 马秋明，赵继德等．EDA仿真软件Multisim2001与两级放大电路仿真．高师理科学刊，2003，23(3)：18-20．
[47] 陈永甫 编著．555集成电路应用800例．北京：电子工业出版社，1992．
[48] 阎石 编著．数字电子技术基础(第四版)．北京：高等教育出版社，1998．
[49] 郭淑珍，吕秋芬，李志华，李秀玲．555定时器应用中地问题探讨．河北师范大学学报(自然科学版)，2002，26(2)：149-152．