功率变流装置中IGBT器件缺陷辨识研究
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摘要
可靠性是制约功率变流装置应用的关键因素之一。研究功率变流装置可靠性衰退评估方法是降低功率变流装置突发故障风险、实现功率变流装置健康运行和降低维护成本的重要举措。近年来，伴随电力电子器件制造技术的进步和变流技术的完善，功率变流装置的应用领域得到极大的拓展，在促进经济发展和社会进步方面开始发挥关键作用，因此可靠性问题日益突出，逐渐成为关注的热点，相关研究方兴未艾。本论文以功率变流装置的核心元件IGBT器件为对象，从状态监测的角度提出“IGBT器件缺陷”的概念，并分析缺陷对其杂散参数的影响，从而根据杂散参数的老化特征，将IGBT器件可靠性衰退评估归结为其缺陷的离线诊断、特征量分析、在线辨识等三个方面的问题进行系统研究，并延伸至健康管理的层面，探讨状态预测的实现。
首先，把握IGBT器件的故障预兆信息，是减少事故发生，从而降低维护成本的有效前提，而缺陷是IGBT器件老化的直接结果，也是降低器件运行可靠性，增加突发故障风险的要素之一。为此，本文从IGBT器件的失效机理出发，分析了其主要的缺陷形式，并给出了缺陷对IGBT器件杂散参数的影响；然后，从杂散参数网络增益变化的角度，提出采用频率响应分析离线诊断IGBT器件缺陷的方法和缺陷评价指标；最后，进行了实验验证，结果表明：该方法能够有效检测出IGBT器件的芯片失效缺陷，可用于功率变流装置的定期检修，是预防IGBT器件故障的一项有效措施。
其次，掌握和跟踪缺陷特征量，是从运行的角度实现IGBT器件可靠性衰退评估的先决条件。然而，IGBT器件老化失效过程中表现出的特征参数很少，通常都难以获取，或是影响因素多且难解耦。为此，本文根据缺陷对IGBT器件门极电路杂散参数的影响，提出采用门极电压和电流的动态变化作为缺陷辨识特征量的新思路，并通过门极电路和主电路之间的耦合分析，从IGBT器件开通时的瞬态过程入手，排除了非线性因素的影响。实验研究证实了以门极电压和电流的动态变化为缺陷特征量的可行性，在一定程度上缓解了IGBT器件缺陷相关信息缺失的困境，为IGBT器件缺陷在线辨识方法的实现奠定了基础。
最后，IGBT器件的失效是依赖于时间的疲劳损伤累积过程，具有一定的随机性，衰退进程存在很大的差异。因此，针对个体IGBT器件的在线缺陷辨识是避免突发故障，从而降低损失的有力保障。为此，本文在离线诊断的基础上，根据IGBT器件杂散参数的老化特征，以门极电压和电流的动态变化为特征量，给出多种缺陷在线辨识的实现方法。这类方法可视为IGBT故障前的实时诊断手段，能够为运行人员赢得宽裕的维护时间，及时替换带有缺陷的IGBT器件，有效减少IGBT器件故障对功率变流装置的影响，避免事故的扩大化。
另外，IGBT器件的状态预测，是从健康管理的层面分析其运行中可靠性衰退的重要手段，也是制定维护计划和实现状态检修的依据。但是由于IGBT器件运行工况的不确定性，自身的复杂性和与可靠性退化程度相关参数的不完全性，常规基于大样本统计参数的概率方法存在难以逾越的瓶颈。为此，本文引入了灰色理论，建立了IGBT器件状态的灰色状态预测模型；并从热疲劳损伤累积的角度，初步探讨了IGBT器件实时故障率的实现。
Reliability is one of the key factors that would limit the applications of powerelectronic converters, so developing evaluation method for the reliability of powerelectronic converters is an important measure to reduce the fault risk, realize the healthyoperation and save the cost of maintenance. In recent years, with the great developmentmade in power electronic technology, the application fields of power electronicconverters have been extended extremely, then power electronic converters start to playa vital role in promoting economic development and social progress. Therefore,reliability issues of power electronic converter are increasingly outstanding andbecoming a hot topic gradually, related research is just in the ascendant. In this paper,IGBTs as key components of power electronic converters are focused on, the defectconcept of IGBTs is proposed from condition monitoring viewpoints. Three aspects,namely, the reliability evaluation of IGBT is summarized to its defect off-line diagnosis,characterizing and on-line monitoring are systematically studied, which then beextended to the health management level, discussing the realization of state predictionfor IGBTs.
Understanding and obtaining precursor information of failure is the basis ofreducing accident and saving maintenance cost. Defects are results of the fatigue, andessential factors in reducing the operational reliability of IGBTs and increasing the riskof an abrupt failure. Therefore, main defect types of IGBTs and their influence onparasitic parameters are analyzed. Then an off-line diagnostic based on frequencyresponse analysis is proposed in this paper. In the end, the correctness and applicationvalue is verified by test results. This method can be used in the regular overhauling ofpower electronic converters, is an effective measure for fault prevention.
Tracing characteristic parameters of defects is a precondition for evaluatingreliability degradation of IGBTs during running. Unfortunately, most of physical wearout mechanisms of IGBTs give very few external indications of impending failure, andthose indications are not only difficult to be obtained but also affected by many factors.To circumvent this limit, the idea of using dynamic changes of gate voltage and currentas characteristic parameters of defects is proposed in this paper. In addition, thefeasibility is verified by experimental study.
The failure of IGBTs depends on the fatigue damage accumulation with runningtime, and many uncertain factors would affect it. Therefore, on-line defect monitoringfor an individual IGBT is an important guarantee for avoiding an abrupt failure. For thispurpose, monitoring methods for defects under running condition are proposed in thispaper, which are based on the aging features of parasitic parameters. Moreover,dynamic changes of gate voltage and current are employed as observable variables tofind out the appearance of defects. These methods can be considered as pre-faultdiagnosis means, which are able to give operators a chance to replace defectivecomponents and avoid accidents enlargement.
Future state evaluation is a very important content of health management forIGBTs, which is an evidence to make the scheduled maintenance and realize theCondition-Based-Maintenance. However, the traditional probabilistic methods based onlarge sample statistics are unable to be applied here, due to uncertain of runningcondition and other factors. For this reason, the gray theory is used in this paper, and agray state prediction model is built up. Besides, the failure rate function of IGBTs basedon the thermal fatigue damage accumulation is also preliminary discussed.
首先，把握IGBT器件的故障预兆信息，是减少事故发生，从而降低维护成本的有效前提，而缺陷是IGBT器件老化的直接结果，也是降低器件运行可靠性，增加突发故障风险的要素之一。为此，本文从IGBT器件的失效机理出发，分析了其主要的缺陷形式，并给出了缺陷对IGBT器件杂散参数的影响；然后，从杂散参数网络增益变化的角度，提出采用频率响应分析离线诊断IGBT器件缺陷的方法和缺陷评价指标；最后，进行了实验验证，结果表明：该方法能够有效检测出IGBT器件的芯片失效缺陷，可用于功率变流装置的定期检修，是预防IGBT器件故障的一项有效措施。
其次，掌握和跟踪缺陷特征量，是从运行的角度实现IGBT器件可靠性衰退评估的先决条件。然而，IGBT器件老化失效过程中表现出的特征参数很少，通常都难以获取，或是影响因素多且难解耦。为此，本文根据缺陷对IGBT器件门极电路杂散参数的影响，提出采用门极电压和电流的动态变化作为缺陷辨识特征量的新思路，并通过门极电路和主电路之间的耦合分析，从IGBT器件开通时的瞬态过程入手，排除了非线性因素的影响。实验研究证实了以门极电压和电流的动态变化为缺陷特征量的可行性，在一定程度上缓解了IGBT器件缺陷相关信息缺失的困境，为IGBT器件缺陷在线辨识方法的实现奠定了基础。
最后，IGBT器件的失效是依赖于时间的疲劳损伤累积过程，具有一定的随机性，衰退进程存在很大的差异。因此，针对个体IGBT器件的在线缺陷辨识是避免突发故障，从而降低损失的有力保障。为此，本文在离线诊断的基础上，根据IGBT器件杂散参数的老化特征，以门极电压和电流的动态变化为特征量，给出多种缺陷在线辨识的实现方法。这类方法可视为IGBT故障前的实时诊断手段，能够为运行人员赢得宽裕的维护时间，及时替换带有缺陷的IGBT器件，有效减少IGBT器件故障对功率变流装置的影响，避免事故的扩大化。
另外，IGBT器件的状态预测，是从健康管理的层面分析其运行中可靠性衰退的重要手段，也是制定维护计划和实现状态检修的依据。但是由于IGBT器件运行工况的不确定性，自身的复杂性和与可靠性退化程度相关参数的不完全性，常规基于大样本统计参数的概率方法存在难以逾越的瓶颈。为此，本文引入了灰色理论，建立了IGBT器件状态的灰色状态预测模型；并从热疲劳损伤累积的角度，初步探讨了IGBT器件实时故障率的实现。
Reliability is one of the key factors that would limit the applications of powerelectronic converters, so developing evaluation method for the reliability of powerelectronic converters is an important measure to reduce the fault risk, realize the healthyoperation and save the cost of maintenance. In recent years, with the great developmentmade in power electronic technology, the application fields of power electronicconverters have been extended extremely, then power electronic converters start to playa vital role in promoting economic development and social progress. Therefore,reliability issues of power electronic converter are increasingly outstanding andbecoming a hot topic gradually, related research is just in the ascendant. In this paper,IGBTs as key components of power electronic converters are focused on, the defectconcept of IGBTs is proposed from condition monitoring viewpoints. Three aspects,namely, the reliability evaluation of IGBT is summarized to its defect off-line diagnosis,characterizing and on-line monitoring are systematically studied, which then beextended to the health management level, discussing the realization of state predictionfor IGBTs.
Understanding and obtaining precursor information of failure is the basis ofreducing accident and saving maintenance cost. Defects are results of the fatigue, andessential factors in reducing the operational reliability of IGBTs and increasing the riskof an abrupt failure. Therefore, main defect types of IGBTs and their influence onparasitic parameters are analyzed. Then an off-line diagnostic based on frequencyresponse analysis is proposed in this paper. In the end, the correctness and applicationvalue is verified by test results. This method can be used in the regular overhauling ofpower electronic converters, is an effective measure for fault prevention.
Tracing characteristic parameters of defects is a precondition for evaluatingreliability degradation of IGBTs during running. Unfortunately, most of physical wearout mechanisms of IGBTs give very few external indications of impending failure, andthose indications are not only difficult to be obtained but also affected by many factors.To circumvent this limit, the idea of using dynamic changes of gate voltage and currentas characteristic parameters of defects is proposed in this paper. In addition, thefeasibility is verified by experimental study.
The failure of IGBTs depends on the fatigue damage accumulation with runningtime, and many uncertain factors would affect it. Therefore, on-line defect monitoringfor an individual IGBT is an important guarantee for avoiding an abrupt failure. For thispurpose, monitoring methods for defects under running condition are proposed in thispaper, which are based on the aging features of parasitic parameters. Moreover,dynamic changes of gate voltage and current are employed as observable variables tofind out the appearance of defects. These methods can be considered as pre-faultdiagnosis means, which are able to give operators a chance to replace defectivecomponents and avoid accidents enlargement.
Future state evaluation is a very important content of health management forIGBTs, which is an evidence to make the scheduled maintenance and realize theCondition-Based-Maintenance. However, the traditional probabilistic methods based onlarge sample statistics are unable to be applied here, due to uncertain of runningcondition and other factors. For this reason, the gray theory is used in this paper, and agray state prediction model is built up. Besides, the failure rate function of IGBTs basedon the thermal fatigue damage accumulation is also preliminary discussed.
引文
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