红外材料低温折射率测量技术研究
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摘要
在现代红外探测中，特别是在红外微弱信号探测中，低温光学系统得到广泛运用。在过去，由于缺少红外材料低温折射率数据，低温光学系统常常采用的是全反射式低温光学系统，随着红外探测任务的发展，全反射式低温光学系统在某些场合已经不能满足任务需要，这就提出研制低温折射式/折返混合式低温光学系统的需求，而低温折射式/折返混合式低温光学系统的研制的一个重要基础就是需要知道红外透射材料在低温下的折射率和折射率温度系数。国外已经在低温折射率测量方面做了较多工作，也获得了许多常见的红外材料低温折射率数据，但是对外公开很少，只是公开了部分可见光下的折射率数据，所以开展对低温折射率测量技术的研究是成功的研制低温折射式/折返混合式低温光学系统的重要基础。
与常温折射率测量相比，低温折射率的测量面临诸多挑战。首先，低温是针对120K以下的温度，也就是-153℃以下的温度，对于如此低的温度，需要在真空环境中获得；其次，待测材料样品从常温到低温，经历近200K的温度变化，样品可能产生的刚体运动和变形会给折射率测量引入误差甚至错误；第三，在与外界隔绝的真空环境中对样品棱镜进行致冷和温控；第四需要在低温真空环境中实现对样品棱镜的控制等。
为了成功研制低温折射率测量系统，并获得红外材料低温下的折射率，课题针对低温折射率测量上述问题进行了研究。首先设计了样品温控和运动控制的载体——样品仓，并根据传热学相关理论，推导出了样品仓温控数学模型。同时利用有限元分法对样品和样品仓的温度场进行分析，获得了样品和样品仓在低温下的温度场特性及样品仓的绝热性能。根据有限元热分析结果，对样品和样品仓进行了热应力耦合分析，获得了样品在低温下的应力和变形。利用光机热集成分析的方法，对低温下折射率测量的误差和精度进行了研究，同时对测量装置的静刚度和动力学特性进行分析，得出了装置中主要部件的静刚度和模态特性与测量误差的关系。最后，根据前面的测量方案，搭建了低温折射率测量相关实验，实验结果与仿真分析结果比较吻合，而且对融石英样品棱镜的低温折射率测量数据与美国NASA测量结果相差只有1.6x10-5，说明该测量方案完全满足低温折射率测量的要求。
Nowadays, the cryogenic optical systems are widely used for IR detection,especially for weak IR signal. In the past, most of the cryogenic optical systemsare reflective. It is very difficult to design refractive cryogenic optical systemsbecause there is lack of cryogenic, infrared and refractive index data. Thereflective cryogenic optical systems have played a significant role in infrareddetection tasks for a long time. As the rapid development of IR detection, thereflective cryogenic optical systems cannot meet the need of tasks. It is the verytime for developing the refractive cryogenic optical systems. One of the keypoints is the cryogenic refractive index of IR materials. Many efforts have beendone to study the cryogenic refractive index of IR materials, but none is open topublic, so, to research on the cryogenic refractive index measuring technologyresearch is a very important foundation for the development of cryogenicrefractive optical system.
Compared with the common refractive index measurement, the cryogenicindex measurement is more challenging. First, the cryogenic temperature isequal to120K, which needs a vacuum environment to maintain such a lowtemperature. Second, the sample material would endure a big change oftemperature, which may cause the deformation or movement of the sample.Third, it is a problem to keep the temperature of sample materials at the settled point. Fourth, it is a problem to rotate the sample prism at the vacuumenvironment.
A sample chamber is designed to solve the problem of temperature detectingand setting of sample prism. The mathematical model of sample chamber isalso acquired. A FEM analysis model is used to get the temperature field andstress of sample chamber and sample prism at the cryogenic temperature. Theerror sources are to be analyzed. The final experiments’ results coincide withthe previous analysis. The cryogenic refractive index of fused Silica is veryclose to the NASA’s result, and the error is about1.6x10-5. It is clear that themethod meet the demand of cryogenic measurement.
与常温折射率测量相比，低温折射率的测量面临诸多挑战。首先，低温是针对120K以下的温度，也就是-153℃以下的温度，对于如此低的温度，需要在真空环境中获得；其次，待测材料样品从常温到低温，经历近200K的温度变化，样品可能产生的刚体运动和变形会给折射率测量引入误差甚至错误；第三，在与外界隔绝的真空环境中对样品棱镜进行致冷和温控；第四需要在低温真空环境中实现对样品棱镜的控制等。
为了成功研制低温折射率测量系统，并获得红外材料低温下的折射率，课题针对低温折射率测量上述问题进行了研究。首先设计了样品温控和运动控制的载体——样品仓，并根据传热学相关理论，推导出了样品仓温控数学模型。同时利用有限元分法对样品和样品仓的温度场进行分析，获得了样品和样品仓在低温下的温度场特性及样品仓的绝热性能。根据有限元热分析结果，对样品和样品仓进行了热应力耦合分析，获得了样品在低温下的应力和变形。利用光机热集成分析的方法，对低温下折射率测量的误差和精度进行了研究，同时对测量装置的静刚度和动力学特性进行分析，得出了装置中主要部件的静刚度和模态特性与测量误差的关系。最后，根据前面的测量方案，搭建了低温折射率测量相关实验，实验结果与仿真分析结果比较吻合，而且对融石英样品棱镜的低温折射率测量数据与美国NASA测量结果相差只有1.6x10-5，说明该测量方案完全满足低温折射率测量的要求。
Nowadays, the cryogenic optical systems are widely used for IR detection,especially for weak IR signal. In the past, most of the cryogenic optical systemsare reflective. It is very difficult to design refractive cryogenic optical systemsbecause there is lack of cryogenic, infrared and refractive index data. Thereflective cryogenic optical systems have played a significant role in infrareddetection tasks for a long time. As the rapid development of IR detection, thereflective cryogenic optical systems cannot meet the need of tasks. It is the verytime for developing the refractive cryogenic optical systems. One of the keypoints is the cryogenic refractive index of IR materials. Many efforts have beendone to study the cryogenic refractive index of IR materials, but none is open topublic, so, to research on the cryogenic refractive index measuring technologyresearch is a very important foundation for the development of cryogenicrefractive optical system.
Compared with the common refractive index measurement, the cryogenicindex measurement is more challenging. First, the cryogenic temperature isequal to120K, which needs a vacuum environment to maintain such a lowtemperature. Second, the sample material would endure a big change oftemperature, which may cause the deformation or movement of the sample.Third, it is a problem to keep the temperature of sample materials at the settled point. Fourth, it is a problem to rotate the sample prism at the vacuumenvironment.
A sample chamber is designed to solve the problem of temperature detectingand setting of sample prism. The mathematical model of sample chamber isalso acquired. A FEM analysis model is used to get the temperature field andstress of sample chamber and sample prism at the cryogenic temperature. Theerror sources are to be analyzed. The final experiments’ results coincide withthe previous analysis. The cryogenic refractive index of fused Silica is veryclose to the NASA’s result, and the error is about1.6x10-5. It is clear that themethod meet the demand of cryogenic measurement.
引文
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4. Martin Harwit, D.P.M., K. Shivanandan and B. J. Zajac, A Liquid Nitrogen Cooled[J],Rocket Borne, Infrared Telescope. APPLIED OPTICS,1966.p1732-1735
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8. J. A. Bamberg, N.H.Z. Desigen and performance of the cryogenic focal plane opticsassembly for the Infrared Astronomical Satellite(IRAS)[C].1984: SPIE.
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11. Bradley J. Frey, D.B.L., Timothy J. Madison. Temperature-dependent refractive indexof silicon and germanium[C]. in Cryogenic Optical Systems and Instruments X.
2006.pJ1-J10
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