摘要
为客观、全面地量化FPGA缺陷检测水平,并以此实现FPGA测试方检测水平比对,在统一的缺陷分类标准基础上,对面向FPGA缺陷的关联分类技术进行研究,借此建立不同项目间统一的水平量化标准,结合马尔科夫链理论,研究针对检测水平变化趋势的分析方法,给出稳定水平量化方法。结合实例,阐述应用该方法的一般步骤,结果验证了该方法在FPGA缺陷检测水平的量化与对比工作上的可行性与有效性。
To objectively and comprehensively quantify the level of FPGA defect detection,and to achieve comparison of detection level,the associative classification technology for FPGA defects was studied based on the unified defect classification standard.The unified standard of level quantification among different projects was established.Combining with Markov chain theory,the analysis method for the trend of detection level was studied,and the stable level quantification method was provided.The general steps of applying the method were illustrated using an example.It is verified that the method is feasible and effective in the quantification and comparison of FPGA defect detection level.
引文
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