详细信息   

• 责任者：Jin Sheng (Key Laboratory of Geo-detection ; Ministry of Education ; China University of Geosciences ; 100083 Beijing ; China) ; Wei Wenbo
• 刊名：Chinese Journal of Geophysics
• 出版年：2010
• 卷期：53(10)
• 关键词：地壳 ; crust ; 大地电磁测深 ; telluric electromagnetic sounding ; 青藏高原 ; Qinghai-Tibetan Plateau
• 页码：p.2376-2385
• 图表：7 illus., 31 refs.
• 分类号：0400
• issnNo：ISSN0001-5733
• isbnNo：CN11-2074/P

摘要

It is shown by magnetotelluric detections that the layers with low electrical resistivity less than 10 Ω·m are distributed in the mid-lower crust of Tibetan Plateau on a large scale. This magnitude of electrical resistivity is far less than the average value in the crust of regions with stable geological structures. According to the analysis, it is proposed that the formation of these low resistivity structures is not caused by metallic minerals, graphite, or salt aqueous fluid, but it is very possible that these highly conductive layers are formed by partial melting of rocks or a combination of partial melting and salt aqueous fluid. The formation of these layers with high electrical conductivity has a strong connection with the dynamic process of plate movement. Highly conductive layers in the crust of Tibetan Plateau might be the electrical signature of the subduction of the India Plate.