Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction

详细信息    Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction

• 出版日期：2002.
• 页数：186 p. :
• 第一责任说明：Yanxia Xie.
• 分类号：a342 ; a323
• ISBN：0493825479(ebk.) :

MARC全文

62h0024468 20140702103031.0 cr un||||||||| 110610s2002 xx ||||f|||d||||||||eng | AAI3063605 0493825479(ebk.) : CNY371.35 NGL NGL NGL a342 ; a323 Xie, Yanxia. Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction [electronic resource] / Yanxia Xie. 2002. 186 p. : digital, PDF file. Chair: H.-R. Wenk. Thesis (Ph.D.)--University of California, Berkeley, 2002. Texture (Crystallography) ; Electrons Diffraction. University of California, Berkeley. aCN bNGL http://pqdt.bjzhongke.com.cn/Detail.aspx?pid=%2fWTz19XpDbU%3d NGL Bs883 rCNY371.35 ; h1 bs1106