MARC全文
62h0024468 20140702103031.0 cr un||||||||| 110610s2002 xx ||||f|||d||||||||eng | AAI3063605 0493825479(ebk.) : CNY371.35 NGL NGL NGL a342 ; a323 Xie, Yanxia. Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction [electronic resource] / Yanxia Xie. 2002. 186 p. : digital, PDF file. Chair: H.-R. Wenk. Thesis (Ph.D.)--University of California, Berkeley, 2002. Texture (Crystallography) ; Electrons Diffraction. University of California, Berkeley. aCN bNGL http://pqdt.bjzhongke.com.cn/Detail.aspx?pid=%2fWTz19XpDbU%3d NGL Bs883 rCNY371.35 ; h1 bs1106