Theoretical considerations in the construction of hard X-ray resonators at inclined incidence with ultra-high efficiency and resolution

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• 作者：Y.-H. Wu ; Y.-Y. Chang ; Y.-W. Tsai and S.-L. Chang
• 关键词：multiple diffraction ; Bragg back reflection ; X-ray Fabry&ndash ; Perot resonator ; X-ray optics ; crystal optics
• 刊名：Journal of Applied Crystallography
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：49
• 期：5
• 页码：1653-1658
• 全文大小：859K
• ISSN：1600-5767

文摘

Detailed considerations of how to construct inclined-incidence hard X-ray resonators are presented. Owing to the symmetry of the crystals used, the Bragg back reflection usually employed in normal-incidence two- and multi-plate resonators to reflect the X-ray beam is often accompanied by unavoidable multiple-beam diffraction, and thus the reflectivity and cavity finesse are quite low. In contrast, crystal-based Fabry–Perot (FP) resonators at inclined incidence utilize multiple-beam diffraction to excite the back reflection inside the resonator to generate FP resonance with high efficiency, while avoiding the incident beam suffering from crystal absorption. The useful characteristics of inclined-incidence resonators are derived from numerical calculations based on the inclined-incidence diffraction geometry and the dynamical theory. Experimental results with Laue inclined incidence are in accordance with the simulation. The sub-millielectronvolt energy resolution and ultra-high efficiency of the transmission spectrum of the proposed resonators are also described.