Rapid measurement scheme for texture in cubic metallic materials using time-of-flight neutron diffraction at iMATERIA

详细信息    查看全文

• 作者：Yusuke Onuki ; Akinori Hoshikawa ; Shigeo Sato ; Pingguang Xu ; Toru Ishigaki ; Yoichi Saito ; Hidekazu Todoroki and Makoto Hayashi
• 关键词：crystallographic texture ; neutron diffraction ; Rietveld texture analysis ; iMATERIA ; steels
• 刊名：Journal of Applied Crystallography
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：49
• 期：5
• 页码：1579-1584
• 全文大小：1200K
• ISSN：1600-5767

文摘

A rapid texture measurement system has been developed on the time-of-flight neutron diffractometer iMATERIA (beamline BL20, MLF/J-PARC, Japan). Quantitative Rietveld texture analysis with a neutron beam exposure of several minutes without sample rotation was investigated using a duplex stainless steel, and the minimum number of diffraction spectra required for the analysis was determined experimentally. The rapid measurement scheme employs 132 spectra, and by this scheme the quantitative determination of volume fractions of texture components in ferrite and austenite cubic phases in a duplex stainless steel can be made in a short time. This quantitative and rapid measurement scheme is based on the salient features of iMATERIA as a powder diffractometer, i.e. a fairly high resolution in d spacing and numerous detectors covering a wide range of scattering angle.