Visualizing Light Scattering in Silicon Waveguides with Black Phosphorus Photodetectors

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• 作者：Tianjiao Wang ; Shuren Hu ; Bhim Chamlagain ; Tu Hong ; Zhixian Zhou ; Sharon M. Weiss and Ya-Qiong Xu
• 刊名：Advanced Materials
• 出版年：2016
• 出版时间：September 7, 2016
• 年：2016
• 卷：28
• 期：33
• 页码：7162-7166
• 全文大小：1099K
• ISSN：1521-4095

文摘

A black phosphorus photodetector is utilized to investigate the light-scattering patterns of a silicon waveguide through wavelength- and polarization-dependent scanning photocurrent measurements. The photocurrent signals exhibit similar patterns to the light-intensity distribution of the waveguide calculated by finite-difference time-domain simulations, suggesting that photoexcited electron–hole pairs in the silicon waveguide can be injected into phosphorene to induce its photoresponse.