Fiducial marker application method for position alignment of in situ multimodal X-ray experiments and reconstructions
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- 作者：Paul A. Shade ; David B. Menasche ; Joel V. Bernier ; Peter Kenesei ; Jun-Sang Park ; Robert M. Suter ; Jay C. Schuren and Todd J. Turner
- 关键词：high-energy diffraction microscopy ; HEDM ; X-ray diffraction ; three-dimensional characterization ; microstructure ; fiducial markers
- 刊名：Journal of Applied Crystallography
- 出版年：2016
- 出版时间：April 2016
- 年：2016
- 卷：49
- 期：2
- 页码：700-704
- 全文大小：582K
- ISSN：1600-5767
文摘
An evolving suite of X-ray characterization methods are presently available to the materials community, providing a great opportunity to gain new insight into material behavior and provide critical validation data for materials models. Two critical and related issues are sample repositioning during an in situ experiment and registration of multiple data sets after the experiment. To address these issues, a method is described which utilizes a focused ion-beam scanning electron microscope equipped with a micromanipulator to apply gold fiducial markers to samples for X-ray measurements. The method is demonstrated with a synchrotron X-ray experiment involving in situ loading of a titanium alloy tensile specimen.