Analysis of stresses and crystal structure in the surface layer of hexagonal polycrystalline materials: a new methodology based on grazing incidence diffraction

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• 作者：Marianna Marciszko ; Andrzej Baczmański ; Chedly Braham ; Mirosław Wr&oacute ; bel ; Wilfrid Seiler ; Sebastian Wroński and Katarzyna Berent
• 关键词：residual stress ; grazing-incidence X-ray diffraction ; synchrotron radiation ; hexagonal structure
• 刊名：Journal of Applied Crystallography
• 出版年：2016
• 出版时间：February 2016
• 年：2016
• 卷：49
• 期：1
• 页码：85-102
• 全文大小：2891K
• ISSN：1600-5767

文摘

The multireflection grazing-incidence X-ray diffraction (MGIXD) method is commonly used to determine a stress gradient in thin surface layers (about 1–20 µm for metals). In this article, the development of MGIXD to enable the determination not only of stresses but also of the m>cm>/m>am> ratio and the m>am>₀ strain-free lattice parameter in hexagonal polycrystalline materials is presented and tested. The new procedure was applied for the results of measurements performed using a laboratory X-ray diffractometer and synchrotron radiation. The evolution of stresses and lattice parameters with depth was determined for Ti and Ti-alloy samples subjected to different mechanical surface treatments. A very good agreement of the results obtained using three different wavelengths of synchrotron radiation as well as classical X-rays (Cu m>Km>α radiation) was found.